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VLSI Yield Prediction and Estimation: A Unified Framework
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986A J Strojwas, S W Director, W Malý
exaly
Accurate Estimation of Defect-Related Yield Loss in Reconfigurable VLSI Circuits
IEEE Journal of Solid-State Circuits, 1993J Khare, W Malý
exaly
The Estimation of Potential Yield and Stock Status Using Lifehistory Parameters
Philosophical Transactions of the Royal Society B: Biological Sciences, 2005exaly
Method and system for crop yield estimation
2018MARGALIT NIR, NITSAN SHAHAR, KULA RAVIV
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