Results 281 to 290 of about 321,240 (314)
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Yield maps for nanoscale metallic multilayers
Scripta Materialia, 2004Abstract This manuscript presents maps for the macroscopic, in-plane, bi-axial tension to macroscopically yield a nanoscale multilayered thin film consisting of alternating phases that can plastically deform. The design parameters are volume fraction, bi-layer thickness, modulus mismatch, and lattice parameter mismatch.
Adrienne V. Lamm, Peter M. Anderson
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Remedial Correction of Yield Map Data
Precision Agriculture, 1999Many yield maps exhibit systematic errors that attenuate the underlying yield variation. Two errors are dealt with in detail in this paper: those that occur when the harvester has a narrow finish to a land and those that occur when the harvester is filling up at the start of a harvest run. The authors propose methods to correct or remove erroneous data
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Statistical technology mapping for parametric yield
ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005., 2005Ashish Kumar Singh +2 more
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Identification of major QTLs for yield-related traits with improved genetic map in wheat
Frontiers in Plant Science, 2023Yunfeng Xu, Yiping Tong, Aimin Zhang
exaly
Using Geospatial Information to Map Yield Gain from the Use of Azospirillum brasilense in Furrow
Agronomy, 2023George Deroco Martins +2 more
exaly
Mapping coffee yield with computer vision
Precision Agriculture, 2022Helizani Couto Bazame +4 more
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