Advanced Electronic Materials, EarlyView.Zirconium, hafnium, and mixed zirconium/hafnium doped indium tin oxide thin films are accessible by atomic layer deposition. The amorphous functional films are about 8 nm thick and show a high interdiffusion of all elements. Their transistor characteristics can be modulated depending on the amount of Zr and Hf oxide phases incorporated in these thin ...
Marie Isabelle Büschges +5 more
wiley +1 more source
Effect of Fe and Si Content on Microstructure and Properties of Al-Cu-Li Alloys. [PDF]
Materials (Basel)Feng T +11 more
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Amorphization of zirconium alloy mechnanical alloying
Metal Powder Report, 1996 openaire +1 more source
Characterization of the Mechanical Response to Residual Stress in Corroded Zirconium Alloys
, 2011 S. Storer
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Interface‐Engineered TiO2 Interlayer for Reliable Hafnia‐Based MFMIS FeFETs
Advanced Electronic Materials, EarlyView.An ultrathin TiO2 interlayer suppresses oxygen‐vacancy formation in HZO‐based MFMIS FeFETs, enabling enlarged memory windows and reduced leakage current with improved switching characteristics. ABSTRACT We investigated a TiO2‐engineered interfacial strategy to enhance the stability and reliability of hafnia‐based ferroelectric field‐effect transistors (
Changhyeon Han +4 more
wiley +1 more source
Effect of Heat Treatment on In Vitro Cytotoxicity of Ti-Nb-Zr Gum Metal Alloy. [PDF]
Materials (Basel)Etemad A +7 more
europepmc +1 more source
the THE EFFECT OF ZIRCONIUM ADDITIVES ON PROPERTIES OF (Cu22%Zn4%Al) SHAPE MEMORY ALLOY
Zainab Hassan, Ekbal Mohammed Saeed
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Emerging Memory and Device Technologies for Hardware‐Accelerated Model Training and Inference
Advanced Electronic Materials, EarlyView.This review investigates the suitability of various emerging memory technologies as compute‐in‐memory hardware for artificial intelligence (AI) applications. Distinct requirements for training‐ and inference‐centric computing are discussed, spanning device physics, materials, and system integration.
Yoonho Cho +6 more
wiley +1 more source
Microstructure and Mechanical Properties of Tungsten Zircaloy-4 Diffusion Welding Interface. [PDF]
Materials (Basel)Wei S +5 more
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Highly Stabilized Ni‐Rich Cathodes Enabled by Artificially Reversing Naturally‐Formed Interface
Advanced Energy Materials, Volume 15, Issue 11, March 18, 2025.The application of Ni‐rich cathode materials is obstructed by interfacial and structural instability. This work proposes a facile and cost‐effective Al‐based vapor‐phase surface reaction strategy on Ni‐rich cathode to maintain its structural integrity from near‐surface to bulk.
Jinjin Ma +11 more
wiley +1 more source