Dianci bileiqi避雷器用ZnO电阻片在运行中难免出现老化，这将导致电阻片电稳定性下降，影响电力系统稳定运行周期。对于ZnO电阻片老化机理以及如何提高ZnO电阻片长期运行的电稳定性成为研究热点。本次研究通过分析显微结构、物相组成、介电频谱以及电气性能探讨渗Bi热处理工艺对ZnO电阻片电稳定性的影响，构建微观本征点缺陷结构与宏观电稳定性之间的关联关系。实验结果表明渗Bi热处理工艺可以使Bi2O3相以及尖晶石相发生转变，改变氧离子的传导率，进而造成氧空位Vo•在耗尽层中的变化，这也使得渗Bi热处理电阻片晶界势垒高度ΦB达到0.
王鑫 +6 more
doaj
[Research progress of microfluidic technology in competitive sports]. [PDF]
Sheng Wu Yi Xue Gong Cheng Xue Za ZhiHu C, Zhang C, Fan Z, Deng X, Liu M.
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[A case of neonatal congenital myasthenic syndrome caused by <i>MUSK</i> gene variants]. [PDF]
Zhongguo Dang Dai Er Ke Za ZhiZhang XL, Sun Y.
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[Mechanisms of Piezo1-mediated microglial ferroptosis in inhibiting spinal cord injury repair]. [PDF]
Zhongguo Xiu Fu Chong Jian Wai Ke Za ZhiWang Z +4 more
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[Research progress in field-effect transistors-based detection of tumor marker carbohydrate antigens]. [PDF]
Sheng Wu Yi Xue Gong Cheng Xue Za ZhiWang W, Qin W, Li J, Chang C.
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电极留边距离对电流冲击下ZnO电阻片通流性能和故障模式的影响
Dianci bileiqi在2 ms方波冲击和4/10 μs大电流冲击下测试了具有不同电极留边距离的ZnO电阻片。结果表明，电极边缘和ZnO电阻片边缘留有一定余量可使冲击下的通流性能表现更稳定、减少分散性，但过多的留边距离则会使承受冲击电流的有限面积减少，留有0.5 mm左右的电极留边距离比较合适。在电流冲击测试过程中，一些ZnO电阻片样品出现故障，包括穿孔、破裂和侧闪。观察发现冲击试验后ZnO电阻片局部微观结构的形态和组成出现变化，被认为是ZnO电阻片劣化或故障的根本原因。
付志瑶, 王博闻, 胡建平, 方针
doaj
[Multi-lead electrocardiogram atrial fibrillation detection algorithm based on multi-scale patch-based attention]. [PDF]
Sheng Wu Yi Xue Gong Cheng Xue Za ZhiWang X, Yan R, Zhang M, Yang C, Gong Y.
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[Duchenne muscular dystrophy-associated cardiomyopathy: advances in diagnosis and management]. [PDF]
Zhongguo Dang Dai Er Ke Za ZhiGu J, Liu YH, Hong SQ.
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[Syringin improves myocardial mitochondrial dynamics and alleviates oxidative stress injury in septic mice by activating SIRT3]. [PDF]
Nan Fang Yi Ke Da Xue Xue BaoLiu Y, Zhang H.
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[Research progress on porous framework material-based immobilized enzyme biosensors for pesticide residue analysis]. [PDF]
Se PuLan ZY +7 more
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