Results 91 to 100 of about 1,250,528 (295)

Sequential tilting 4D-STEM

open access: yes
This dataset contains scripts for acquiring sequential tilting 4D-STEM series, tools for analyzing them, and sequential tilting 4D-STEM raw data. DigitalMicrograph scripts are provided for calibrating beam tilt and tilt-induced beam shift, and for ...
Meyer, Tobias   +6 more
core   +1 more source

A variant in LIN28B is associated with 2D:4D finger-length ratio, a putative retrospective biomarker of prenatal testosterone exposure [PDF]

open access: yes, 2010
The ratio of the lengths of an individual's second to fourth digit (2D:4D) is commonly used as a noninvasive retrospective biomarker for prenatal androgen exposure.
Medland, Sarah E   +58 more
core   +2 more sources

Correlative study between the local atomic and electronic structures of amorphous carbon materials via 4D-STEM and STEM-EELS

open access: yes, 2022
© 2022 Author(s).Amorphous materials have been used in a range of electronic and photonic applications, and the need for quantitative analytical techniques on their local structural information is growing.
Joo, Young-Chang   +9 more
core   +1 more source

Elastic–Plastic Modeling and Experimental Characterization of Granular Jamming Actuators

open access: yesAdvanced Engineering Materials, EarlyView.
Granular jamming enables rapid switching between soft and rigid mechanical states. Here, a reduced‐order elastic‐perfectly‐plastic beam framework captures pressure‐dependent loading, unloading, residual deformation, and hysteresis in jammed beams, while matching three‐point bending experiments across materials and geometries. The framework links design
Saheli Patel   +2 more
wiley   +1 more source

4D Analytical STEM with the pnCCD [PDF]

open access: yesMicroscopy and Microanalysis, 2018
Huth, M   +10 more
openaire   +1 more source

Event-sparse stack denoising for 4D-STEM applications

open access: yesUltramicroscopy
We introduce a denoising method for four-dimensional scanning transmission electron microscopy (4D-STEM) for Bragg diffraction analysis that relies on processing local, scan position-independent electron event-sparse data stacks, called event-sparse stack denoising.
Gregory Nordahl   +3 more
openaire   +2 more sources

Intermediate Resistive State in Wafer‐Scale Vertical MoS2 Memristors Through Lateral Silver Filament Growth for Artificial Synapse Applications

open access: yesAdvanced Functional Materials, EarlyView.
In MOCVD MoS2 memristors, a current compliance‐regulated Ag filament mechanism is revealed. The filament ruptures spontaneously during volatile switching, while subsequent growth proceeds vertically through the MoS2 layers and then laterally along the van der Waals gaps during nonvolatile switching.
Yuan Fa   +19 more
wiley   +1 more source

Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis

open access: yesScientific Reports
Unsupervised machine learning techniques have been combined with scanning transmission electron microscopy (STEM) to enable comprehensive crystal structure analysis with nanometer spatial resolution.
Koji Kimoto   +5 more
doaj   +1 more source

Integration of Low‐Voltage Nanoscale MoS2 Memristors on CMOS Microchips

open access: yesAdvanced Functional Materials, EarlyView.
This article presents the first monolithic integration of nanoscale MoS2‐based memristors into the back‐end‐of‐line of foundry‐fabricated CMOS microchips in a one‐transistor‐one‐resistor (1T1R) architecture. The MoS2‐based 1T1R cells exhibit forming‐free, nonvolatile resistive switching with ultra‐low operating voltages, low cycle‐to‐cycle variability ...
Jimin Lee   +16 more
wiley   +1 more source

On the use of clustering workflows for automated microstructure segmentation of analytical STEM datasets

open access: yesAPL Materials
This study considers the issue of automated segmentation of scanning transmission electron microscopy (STEM) datasets using unsupervised machine learning approaches.
Zhiquan Kho   +5 more
doaj   +1 more source

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