Results 211 to 220 of about 1,072,172 (308)
Some of the next articles are maybe not open access.
Accelerated shelf life testing
Food Quality and Shelf Life, 2019Shelf life assessment of food has always represented an exciting challenge for scientists, but it is also a fundamental process for food companies to maintain their brand reputation on the market.
Calligaris, S +3 more
openaire +2 more sources
Reliability estimation for one-shot devices under cyclic accelerated life-testing
Reliability Engineering & System Safety, 2021A one-shot device, like an automobile airbag, is a product or an equipment that can be used only once. Better quality and longer lifetime of one-shot devices nowadays increase the cost of life test experiment under normal operating condition.
Xiaojun Zhu +3 more
semanticscholar +1 more source
Accelerated Life Testing Method of Metallized Film Capacitors for Inverter Applications
IEEE Transactions on Transportation Electrification, 2021DC-link capacitors are one kind of reliability-critical component in traction inverters. As such, it is essential to evaluate the degradation characteristics of dc-link capacitors.
Weiyang Zhou +6 more
semanticscholar +1 more source
Journal of Computational and Applied Mathematics, 2020
This article uses three optimality criteria to conclude the optimal allocation of multiple accelerated life testing for the generalized half-normal model under type-I censoring.
A. A. El-Raheem
semanticscholar +1 more source
This article uses three optimality criteria to conclude the optimal allocation of multiple accelerated life testing for the generalized half-normal model under type-I censoring.
A. A. El-Raheem
semanticscholar +1 more source
Nonparametric Accelerated Life Testing
IEEE Transactions on Reliability, 1982This paper considers the problem of nonparametric accelerated life testing by extending the results of Shaked & Singpurwalla in two directions. First we solve the case of censored data. Next we extend the methods to the case of competing risks. A s-consistent estimate of the failure distribution at use-stress is given for both cases.
Basu, A. P., Ebrahimi, Nader
openaire +2 more sources
IEEE Transactions on Industrial Informatics, 2023
In order to achieve fault diagnosis and prognosis, one needs a sufficient and valid life-cycle data. However, this requirement is difficult for current high-reliable manufacturing system.
Yang Li +4 more
semanticscholar +1 more source
In order to achieve fault diagnosis and prognosis, one needs a sufficient and valid life-cycle data. However, this requirement is difficult for current high-reliable manufacturing system.
Yang Li +4 more
semanticscholar +1 more source