Results 221 to 230 of about 122,717 (261)
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A pitfall in accelerated life testing

Naval Research Logistics Quarterly, 1963
AbstractThe Managing Editor invites communications which are consistent with the objectives of the Naval Research Logistics Quarterly. No communication will be printed without the expressed consent of the author. All views represented are those of the author and are not to be regarded as the opinion of the Naval Research Logistics Quarterly or any ...
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A Problem in Accelerated Life Testing

Journal of the American Statistical Association, 1971
Abstract Parameters of the Power Rule Model are estimated using data from censored sample life tests conducted at accelerated environments. By amending the functional form of the model, it is possible to obtain estimators that are asymptotically independent.
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A Bayesian Method for Planning Accelerated Life Testing

IEEE Transactions on Reliability, 2015
In this paper, a Bayesian criterion is proposed based on the expected Kullback-Leibler divergence between the posterior and the prior distributions of the parameters of interest. We call the Bayesian criterion the reference optimality criterion, which is to find an optimal plan to maximize the amount of information from the data.
Ancha Xu, Yincai Tang
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A model for step‐stress accelerated life testing

Naval Research Logistics (NRL), 2003
AbstractModern technology is producing high reliability products. Life testing for such products under normal use condition takes a lot of time to obtain a reasonable number of failures. In this situation a step‐stress procedure is preferred for accelerated life testing.
Dharmadhikari, A. D., Rahman, Md. Monsur
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Accelerated Life Testing of Capacitors

IRE Transactions on Reliability and Quality Control, 1957
One of the problems facing the designer of modern electronic communication systems is the ultimate reliability to be achieved under service conditions. The required level of reliability together with the unavoidable complexity of present-day equipment calls for components having extremely low failure rates.
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Model-Robust Test Plans With Applications in Accelerated Life Testing

Technometrics, 2003
We study a criterion based on a weighted asymptotic sample ratio (ASR) that yields model-robust test plans with relatively low ASRs under different models. We apply the criterion to accelerated life test planning in which interest lies in estimating life quantiles and there is uncertainty as to whether the Weibull or the lognormal model best describes ...
Francis G. Pascual, Grace Montepiedra
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A general hazard regression modelfor accelerated life testing

Annals of Operations Research, 1999
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Huan-Jyh Shyur   +2 more
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On Imprecise Statistical Inference for Accelerated Life Testing

2016
Accelerated life testing provides an interesting challenge for quantification of the uncertainties involved, in particular due to the required linking of items’ failure times, or failure time distributions, at different stress levels. This paper provides an initial exploration of the use of statistical methods based on imprecise probabilities for ...
Frank P. A. Coolen   +2 more
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Estimation for a weibull accelerated life testing model

Naval Research Logistics Quarterly, 1984
AbstractIt is sometimes reasonable to assume that the lifetime distribution of an item belongs to a certain parametric family, and that actual parameter values depend upon the testing environment of the item. In the two‐parameter Weibull family setting, suppose both the shape and scale parameters are expressible as functions of the testing environment.
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Accelerated Life Tests at Higher Usage Rates

IEEE Transactions on Reliability, 2005
Accelerated life tests are extensively used to provide quickly the information about the life distributions of products. Test units are subjected to elevated stresses which yield shorter lives. For some products whose life is defined by usage, e.g., mileage and cycles, test units are also run at higher usage rates (UR) to compress the test time.
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