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Accelerated Shelf Life Testing
Dong Sun Lee
, Kit L Yam, Luciano Piergiovanni
+2 more
openaire
copy doi
(10.1016/b978-0-443-34158-8.00029-3)
openaccessbutton.org (pdf)
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reliability
maximum likelihood estimation
reliability and life testing
shelf life
accelerated life test
weibull distribution
constant stress
exponential distribution
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