Results 91 to 98 of about 140 (98)

Interface characterization of Si-passivated HfO2 germanium capacitors using DLTS measurements

Materials Science in Semiconductor Processing, 2006
E Simoen, B De Jaeger, Marc Meuris
exaly  

DLTS and MCTS analysis of the influence of growth pressure on trap generation in MOCVD GaN

Solid-State Electronics, 2012
K A Jones
exaly  

Correlation between barrier inhomogeneities of 4H-SiC 1A/600V Schottky rectifiers and deep-level defects revealed by DLTS and Laplace DLTS

Solid-State Electronics, 2014
Łukasz Gelczuk, E Płaczek-Popko, M Dąbrowska-Szata   +2 more
exaly  

Study of thin film CuInS2-on-Cu-tape (CISCuT) solar cells using deep level transient spectroscopy (DLTS)

Thin Solid Films, 2007
P Clauws
exaly  

Electrical characterization and DLTS analysis of a gold/n-type gallium nitride Schottky diode

Materials Science in Semiconductor Processing, 2014
J H Evans-Freeman, M M El-Nahass, M J Kappers   +2 more
exaly  

DLTS characterization of defects in GaN induced by electron beam exposure

Materials Science in Semiconductor Processing, 2017
F D Auret, E Omotoso, Mmantsae Dialé
exaly  

Recalling the origins of DLTS

Physica B: Condensed Matter, 2007
exaly  

DLTS study of n-type GaN grown by MOCVD on GaN substrates

Superlattices and Microstructures, 2006
exaly