Results 271 to 280 of about 133,377 (302)

DEPFET active pixel sensor with non-linear amplification

2011 IEEE Nuclear Science Symposium Conference Record, 2011
One of the X-ray imaging detectors in development for the European XFEL (X-ray Free Electron Laser) is the DSSC (DEPFET Sensor with Signal Compression). The DSSC sensor array will have a format of 1024 × 1024 pixels with a pixel size in the order of 200 µm.
Lechner, P, Andricek, L, Aschauer, S, Bahr, A, De Vita, G, Hermenau, K, Hildebrand, T, Lutz, G, Majewski, P, Porro, M, Richter, RH, Sandow, C, Schaller, G, Soltau, H, Struder, L   +14 more
openaire   +2 more sources

Fault tolerant photodiode and photogate active pixel sensors

SPIE Proceedings, 2005
As digital imaging arrays increase in size and resolution, defect correction could lower costs and improve yields. A fault tolerant active pixel sensor (APS) has been designed that will operate in the presence of a single point defect. The photosensitive area of the pixel is split in half and both halves operate in parallel.
Cory Jung, Glenn H. Chapman, Michelle L. La Haye, Sunjaya Djaja, Desmond Y. H. Cheung, Henry Lin, Edward Loo, Yves R. Audet   +7 more
openaire   +1 more source

Active pixel sensors on high resistivity silicon and their readout

2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310), 2002
The concept of X-ray active matrix pixel sensor (XAMPS) is introduced. XAMPSs are direct illumination, position sensitive X-ray detectors with the possibility of containing 1000 000 pixels. They count the number of diffracted X-rays in each pixel by measuring the total charge released by converted X-rays in the body of the sensor.
W. Chen, G. De Geronimo, Z. Li, P. O'Connor, V. Radeka, P. Rehak, G.C. Smith, B. Yu   +7 more
openaire   +1 more source

A 1V Current-Mode CMOS Active Pixel Sensor

2005 IEEE International Symposium on Circuits and Systems, 2005
A low-voltage current-mode active pixel sensor (APS) capable of operating from a 1 V power supply in a 0.35 /spl mu/m standard CMOS process is proposed. The pixel utilizes a PMOS transistor biased in the linear region of operation to produce an output current linearly proportional to the integrated voltage.
Ralf M. Philipp, Ralph Etienne-Cummings
openaire   +1 more source

An Active Pixel CMOS separable transform image sensor

2009 IEEE International Symposium on Circuits and Systems, 2009
This paper presents a 128×128 charge-mode CMOS imaging sensor that computes separable transforms directly on the focal plane. The pixel is a unique extension of the widely reported Active Pixel Sensor (APS) cell. By capacitively coupling across an array of such cells onto switched capacitor circuits, computation of any unitary 2-D transform that is ...
Yu M. Chi, Adeel Abbas, Shantanu Chakrabartty, Gert Cauwenberghs   +3 more
openaire   +1 more source

A VHDL-AMS Configuration for Active Pixel Sensors.

2004
no ...
Dadouche, Foudil, Alexandre, Annick, Granado, Bertrand, Pinna, Andrea, Garda, Patrick   +4 more
openaire   +2 more sources

Creating 35 mm camera active pixel sensors

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99), 2003
A 36/spl times/24 mm active pixel sensor imaging area device is studied which would be ideal for use with standard 35 mm cameras. By applying multichip methods to active pixel sensors, the 39/spl times/30 mm system contains on board all the control circuitry and A/D converters, so the system outputs digital data. The large area requires a redundancy of
Glenn H. Chapman, Yves Audet
openaire   +1 more source

CMOS Active Pixel Sensors for High Energy Physic

2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI), 2019
CMOS technology, which fueled the rapid growth of the information technology industry in the past 50 years, has also played and continues to play a crucial role in the remarkable development of detectors for High-Energy Physics (HEP) experiments.
openaire   +1 more source

Study of a BIST Technique for CMOS Active Pixel Sensors

2006 IFIP International Conference on Very Large Scale Integration, 2006
The production test of CMOS image sensors is complicated and expensive as an electrical and an optical test must be executed for the pixel matrix. In this paper we study a Built-In-Self-Test (BIST) technique for the pixels. The technique is based on applying a voltage stimulus at the photosensitive element of the image sensor.
Livier Lizarraga, Salvador Mir, Gilles Sicard, Ahcène Bounceur   +3 more
openaire   +1 more source

CMOS Active Pixel Sensors

2022
Konstantin D. Stefanov, Andrew D. Holland   +1 more
openaire   +1 more source