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Transient fault sensitivity analysis of analog-to-digital converters (ADCs)

Proceedings IEEE Computer Society Workshop on VLSI 2001. Emerging Technologies for VLSI Systems, 2002
Reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. It is important to analyze the fault sensitivities of each of these to effectively gauge and improve the ...
Singh, M, Rachala, R, Koren, I
openaire   +2 more sources

Dynamic Stage Element Matching (DSEM) in Pipeline Analog to Digital Converters (ADC)

2012 IEEE International Conference on IC Design & Technology, 2012
In this paper, a novel compensation method, Dynamic Stage Element Matching (DSEM), is introduced. This paper provides a comparison of existing error compensation methods and DSEM. DSEM extends Dynamic Element Matching (DEM) of Digital to Analog Converters (DAC) to entire stages of a pipeline ADC.
Francis Fradette   +3 more
openaire   +2 more sources

High performance analog-to-digital converters (ADCs) for signal processing

ICMMT 2000. 2000 2nd International Conference on Microwave and Millimeter Wave Technology Proceedings (Cat. No.00EX364), 2002
Analog-to-digital converters (ADCs) are widely used for signal processing in radar, communication and electronic warfare (EW) systems, where speed and resolution are of paramount importance. Significant improvement in dynamic range and clutter rejection are dependent on critical parameters of the ADC devices used by the radar signal processors.
openaire   +1 more source

Properties and Use of Digital-to-Analog (DAC) and Analog-to-Digital (ADC) Converters

1975
Most laboratory instruments either produce or accept analog or continuous signals of some form. In order for a digital computer to be able to communicate with an analog instrument, digital-analog interconversions must be made. There are several different ways to construct devices to accomplish this.
Charles L. Wilkins   +4 more
openaire   +1 more source

Memristor-assisted background calibration for analog-to-digital converters (ADCs)

This thesis describes the main works undertaken to explore the feasibility of exploiting the memristor to improve the linearity of the ADC (i.e., integral non-linearity (INL), differential non-linearity (DNL), signal-to-noise-and-distortion ratio (SNDR), and spurious-free dynamic range (SFDR)).
openaire   +1 more source

ANALOG-TO-DIGITAL CONVERTER (ADC) TESTING

2022
JIN XIANKUN   +3 more
openaire   +2 more sources

A 5-GS/s 158.6-mW 9.4-ENOB Passive-Sampling Time-Interleaved Three-Stage Pipelined-SAR ADC With Analog–Digital Corrections in 28-Nm CMOS

IEEE Journal of Solid-State Circuits, 2020
Michiel Steyaert   +2 more
exaly  

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