Results 91 to 100 of about 31,828 (175)

Atomic scale investigation of silicon nanowires and nanoclusters

Nanoscale Research Letters, 2011
In this study, we have performed nanoscale characterization of Si-clusters and Si-nanowires with a laser-assisted tomographic atom probe. Intrinsic and p-type silicon nanowires (SiNWs) are elaborated by chemical vapor deposition method using gold as ...
Gourbilleau Fabrice, Grandidier Bruno, Stiévenard Didier, Roussel Manuel, Chen Wanghua, Talbot Etienne, Lardé Rodrigue, Cadel Emmanuel, Pareige Philippe   +8 more
doaj  

Si/Ge intermixing during Ge Stranski–Krastanov growth

Beilstein Journal of Nanotechnology, 2014
The Stranski–Krastanov growth of Ge islands on Si(001) has been widely studied. The morphology changes of Ge islands during growth, from nucleation to hut/island formation and growth, followed by hut-to-dome island transformation and dislocation ...
Alain Portavoce, Khalid Hoummada, Antoine Ronda, Dominique Mangelinck, Isabelle Berbezier   +4 more
doaj   +1 more source

Atom probe tomography using an extreme ultraviolet trigger pulse. [PDF]

Rev Sci Instrum, 2023
Caplins BW, Chiaramonti AN, Garcia JM, Sanford NA, Miaja-Avila L.   +4 more
europepmc   +1 more source

Bone hierarchical organization through the lens of materials science: Present opportunities and future challenges

Bone Reports
Multiscale characterization is essential to better understand the hierarchical architecture of bone and an array of analytical methods contributes to exploring the various structural and compositional aspects.
Chiara Micheletti, Furqan A. Shah
doaj   +1 more source

Elucidating the Structure and Composition of Individual Bimetallic Nanoparticles in Supported Catalysts by Atom Probe Tomography. [PDF]

J Am Chem Soc, 2023
Zand F, Hangx SJT, Spiers CJ, van den Brink PJ, Burns J, Boebinger MG, Poplawsky JD, Monai M, Weckhuysen BM.   +8 more
europepmc   +1 more source

Atomic characterization of Si nanoclusters embedded in SiO₂ by atom probe tomography

Nanoscale Research Letters, 2011
Silicon nanoclusters are of prime interest for new generation of optoelectronic and microelectronics components. Physical properties (light emission, carrier storage...) of systems using such nanoclusters are strongly dependent on nanostructural ...
Gourbilleau Fabrice, Roussel Manuel, Talbot Etienne, Pareige Philippe   +3 more
doaj  

Sn doping-induced nanostructure refinement and magnetic softening in high-Bs Fe-Si-B-Cu nanocrystalline alloys

Materials Research Letters
Minor Sn doping into Fe81.5Si4B13Cu1.5 promotes Cu clustering around Sn atoms in melt-spun amorphous matrix, which in turn induces a high number-density (Nd) of pre-existing α-Fe nanograins averaging 6.0 nm in size.
Junsheng Xue, Wei Zhang, Zhengwang Zhu, Yanhui Li, Li Jiang, Junhua Luan, Haifeng Zhang   +6 more
doaj   +1 more source

Quantitative three-dimensional imaging of chemical short-range order via machine learning enhanced atom probe tomography. [PDF]

Nat Commun, 2023
Li Y, Wei Y, Wang Z, Liu X, Colnaghi T, Han L, Rao Z, Zhou X, Huber L, Dsouza R, Gong Y, Neugebauer J, Marek A, Rampp M, Bauer S, Li H, Baker I, Stephenson LT, Gault B.   +18 more
europepmc   +1 more source

Atom Probe Tomography experiments performed in a (Scanning) Transmission Electron Microscope [PDF]

BIO Web of Conferences
Lefebvre Williams, Da Costa Gérald, Celia Castro, Normand Antoine, Vaudolon Charly, Zakirov Aidar, Macchi Juan, Ilhami Mohammed, Vurpillot François   +8 more
doaj   +1 more source

Nanoscale Clustering in an Additively Manufactured Zr-Based Metallic Glass Evaluated by Atom Probe Tomography. [PDF]

Nanomaterials (Basel), 2023
Goetz IK, Sälker JA, Hans M, Hjörvarsson B, Schneider JM.   +4 more
europepmc   +1 more source