Results 101 to 110 of about 223,394 (299)

Magnetic force microscopy of atherosclerotic plaque.

open access: yesMedičnì Perspektivi, 2014
In this work by methods of scanning probe microscopy, namely by atomic force microscopy and magnetic force microscopy the fragments of atherosclerotic plaque section of different nature were investigated.
T. A. Alexeeva   +4 more
doaj   +1 more source

Scanning Surfaces Solid Structures and Oil-Waist Var Systems by Atomic Force Microscopy [PDF]

open access: yes, 2017
Работы, выполненные с помощью атомно-силового микроскопа NT-207, показали большие возможности исследования поверхности веществ методами сканирующей зондовой микроскопии.
Вабищевич, С. А.   +2 more
core  

Understanding and Optimizing Li Substitution in P2‐Type Sodium Layered Oxides for Sodium‐Ion Batteries

open access: yesAdvanced Functional Materials, EarlyView.
This work explores Li‐substituted P2 layered oxides for Na‐ion batteries by crystallographic and electrochemical studies. The effect of lithium on superstructure orderings, on phase transitions during synthesis and electrochemical cycling and on the interplay of O‐ versus TM‐redox is revealed via various advanced techniques, including semi‐simultaneous 
Mingfeng Xu   +5 more
wiley   +1 more source

Synthesis of atomically thin hexagonal boron nitride films on nickel foils by molecular beam epitaxy

open access: yes, 2015
Hexagonal boron nitride (h-BN) is a layered two-dimensional material with properties that make it promising as a dielectric in various applications. We report the growth of h-BN films on Ni foils from elemental B and N using molecular beam epitaxy.
Hanke, M.   +7 more
core   +1 more source

Quantum Emitters in Hexagonal Boron Nitride: Principles, Engineering and Applications

open access: yesAdvanced Functional Materials, EarlyView.
Quantum emitters in hexagonal boron nitride have emerged as a promising candidate for quantum information science. This review examines the fundamentals of these quantum emitters, including their level structures, defect engineering, and their possible chemical structures.
Thi Ngoc Anh Mai   +8 more
wiley   +1 more source

Crafting at the nanoscale: A comprehensive review of mechanical Atomic force microscopy-based lithography methods and their evolution

open access: yesMaterials & Design
In recent years, the scientific community’s interest in nanoscience and nanotechnology stems from the increasing capability to manipulate matter at the nanoscale.
Lorenzo Vincenti   +6 more
doaj   +1 more source

Self-assembly and electron-beam-induced direct etching of suspended graphene nanostructures

open access: yes, 2011
We report on suspended single-layer graphene deposition by a transfer-printing approach based on polydimethylsiloxane stamps. The transfer printing method allows the exfoliation of graphite flakes from a bulk graphite sample and their residue-free ...
Fabio Beltram   +7 more
core   +1 more source

Scanning probe – atomic force microscopy: new developments and applications

open access: yesIOP Conference Series: Materials Science and Engineering, 2014
Recent developments in scanning probe microscopy (SPM) have widened the spectrum of possible investigations that can be performed at a nanometric level at the surfaces of materials. They range, for instance, from physical properties such as surface potential and electric field topological determination to chemical, nanomechanical, catalytic and ...
VALDRE', GIOVANNI   +2 more
openaire   +1 more source

Synchrotron Radiation for Quantum Technology

open access: yesAdvanced Functional Materials, EarlyView.
Materials and interfaces underpin quantum technologies, with synchrotron and FEL methods key to understanding and optimizing them. Advances span superconducting and semiconducting qubits, 2D materials, and topological systems, where strain, defects, and interfaces govern performance.
Oliver Rader   +10 more
wiley   +1 more source

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

open access: yesBeilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin   +6 more
doaj   +1 more source

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