Results 251 to 260 of about 223,394 (299)

Scanning tunneling microscopy, atomic force microscopy, and related techniques

Analytical Chemistry, 1992
Abstract : This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.
Shelly R. Snyder, Henry S. White
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Viewing molecules with scanning tunneling microscopy and atomic force microscopy

The FASEB Journal, 1990
Two new microscopic techniques make it possible to obtain images of biologically interesting molecules directly in air, vacuum, or under water. Scanning tunneling microscopy and atomic force microscopy both have the capacity to visualize atoms on the surface of rigid structures and provide details of molecular structure for lipids,
R D, Edstrom, X R, Yang, G, Lee, D F, Evans   +3 more
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Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1988
Since almost all the electronic and mechanical requirements for an atomic force microscope (AFM) are the same as for a scanning tunneling microscope (STM), it is convenient and practical to build a combination AFM/STM with interchangeable heads. The conversion from one to the other can be made in a few minutes.
O. Marti, B. Drake, S. Gould, P. K. Hansma   +3 more
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Scanning Tunneling and Atomic Force Microscopies

1994
The scanning tunneling microscope (STM) developed by Binnig and Rohrert(1–3) at the IBM Zurich research laboratory in the early 1980s was the first example of a new family of instruments based on a concept radically different from that of the optical and electron microscopes.
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Simultaneous Scanning Ion Conductance Microscopy and Atomic Force Microscopy with Microchanneled Cantilevers

Physical Review Letters, 2015
We combined scanning ion conductance microscopy (SICM) and atomic force microscopy (AFM) into a single tool using AFM cantilevers with an embedded microchannel flowing into the nanosized aperture at the apex of the hollow pyramid. An electrode was positioned in the AFM fluidic circuit connected to a second electrode in the bath.
Ossola, Dario, Dorwling-Carter, Livie, Dermutz, Harald, Behr, Pascal, Vörös, János, Zambelli, Tomaso   +5 more
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Spiral Scanning Method for Atomic Force Microscopy

Journal of Nanoscience and Nanotechnology, 2010
A spiral scanning method is proposed for atomic force microscopy with thoroughgoing analysis and implementation. Comparing with the traditional line-by-line scanning method, the spiral scanning method demonstrates higher imaging speed, minor image distortion, and lower acceleration, which can damage the piezoelectric scanner.
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Scan speed limit in atomic force microscopy

Journal of Microscopy, 1993
SUMMARYThe scan speed limit of atomic force microscopes has been calculated. It is determined by the spring constant of the cantilever k, its effective mass m, the damping constant D of the cantilever in the surrounding medium and the stiffness of the sample. Techniques to measure k, k/m and D/m are described.
Butt, H., Siedle, P., Seifert, K., Fendler, K., Seeger, T., Bamberg, E., Weisenhorn, A., Goldie, K., Engel, A.   +8 more
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Scanning tunneling and atomic force microscopy combined

Applied Physics Letters, 1988
The technique described here provides scanning tunneling microscopy (STM) and atomic force microscopy (AFM) in one instrument. Both STM and AFM operations are accomplished by the same device applied to the same sample area. The same metallic probe interacts with the sample in both modes of operation. Switching from STM to AFM can occur automatically or
P. J. Bryant, R. G. Miller, R. Yang
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Force Sensors for Parallel Scanning Atomic Force Microscopy

2002
Since its invention in 1986, the Atomic Force Microscope (AFM) [106] has evolved at an exceptional speed from a laboratory prototype to a commercial instrument utilized in several areas of research as well as in industrial applications, e.g. for quality control. These instruments have improved in quality and usability significantly over the last decade.
D. Lange, O. Brand, H. Baltes
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Scanning tunnelling microscopy and atomic force microscopy of carbondiamond films

Diamond and Related Materials, 1992
Abstract We have used both scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) to image and measure electrical properties of diamond films. The carbon-diamond films were deposited on {100}, 1–5 W cm, n-type Si substrates from a 13.56 MHz, capacitively coupled CH 4 Ar rf plasma. Film thicknesses ranged from 10 nm to 150
M.E. Welland, A.W. McKinnon, S. O'Shea, G.A.J. Amaratunga   +3 more
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