Results 11 to 20 of about 613,647 (384)

Magnetic-Dielectric Cantilevers for Atomic Force Microscopy [PDF]

Nanomaterials
Atomic force microscopy (AFM) is a technique that relies on detecting forces at the nanonewton scale. It involves using a cantilever with a tiny tip at one end. This tip interacts with the short- and long-range forces of material surfaces.
Gala Sanchez-Seguame, Hugo Avalos-Sanchez, Jesus Eduardo Lugo, Eduardo Antonio Murillo-Bracamontes, Martha Alicia Palomino-Ovando, Orlando Hernández-Cristobal, José Juan Gervacio-Arciniega, Miller Toledo-Solano   +7 more
doaj   +2 more sources

Advanced atomic force microscopy techniques V [PDF]

Beilstein Journal of Nanotechnology
Philipp Rahe, Ilko Bald, Nadine Hauptmann, Regina Hoffmann-Vogel, Harry Mönig, Michael Reichling   +5 more
doaj   +2 more sources

Bearingless Inertial Rotational Stage for Atomic Force Microscopy [PDF]

Micromachines
We introduce a novel rotational stage based on inertial motion, designed to be lightweight, compact, and fully compatible with atomic force microscopy (AFM) systems.
Eva Osuna, Aitor Zambudio, Pablo Ares, Cristina Gómez-Navarro, Julio Gómez-Herrero   +4 more
doaj   +2 more sources

Shale adhesion force measurements via atomic force microscopy

Oil & Gas Science and Technology, 2021
Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous ...
Mitiurev Nikolai, Verrall Michael, Shilobreeva Svetlana, Keshavarz Alireza, Iglauer Stefan   +4 more
doaj   +1 more source

Atomic force microscopy

Chemistry & Biology, 1999

  +6 more sources

Dual-pulse photoactivated atomic force microscopy

Scientific Reports, 2021
Photoactivated atomic force microscopy (pAFM), which integrates light excitation and mechanical detection of the deflections of a cantilever tip, has become a widely used tool for probing nanoscale structures.
Byullee Park, Seunghyun Lee, Jimin Kwon, Woojo Kim, Sungjune Jung, Chulhong Kim   +5 more
doaj   +1 more source

Atomic Force Microscopy and Real Atomic Resolution. Simple Computer Simulations. [PDF]

, 1994
Using a simple computer simulation for AFM imaging in the contact mode, pictures with true and false atomic resolution are demonstrated. The surface probed consists of two f.c.c.
Brinke, G. ten,, Hadziioannou, G.,, Koutsos, V.,, Manias, E.,   +3 more
core   +6 more sources

Automated structure discovery in atomic force microscopy [PDF]

Science Advances, 2019
We develop a deep learning method that predicts atomic structure directly from experimental atomic force microscopy images. Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the ...
Benjamin Alldritt, P. Hapala, Niko Oinonen, Fedor Urtev, O. Krejčí, F. Federici Canova, Juho Kannala, F. Schulz, P. Liljeroth, A. Foster   +9 more
semanticscholar   +1 more source

Atomic Force Microscopy-Based Force Spectroscopy and Multiparametric Imaging of Biomolecular and Cellular Systems.

Chemical Reviews, 2020
During the last three decades, a series of key technological improvements turned atomic force microscopy (AFM) into a nanoscopic laboratory to directly observe and chemically characterize molecular and cell biological systems under physiological ...
D. Müller, Andra C Dumitru, Cristina Lo Giudice, H. Gaub, P. Hinterdorfer, G. Hummer, J. D. De Yoreo, Y. Dufrêne, D. Alsteens   +8 more
semanticscholar   +1 more source

Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers, 2020
Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light ...
P. Nguyen‐Tri, Payman Ghassemi, Pascal Carrière, S. Nanda, A. Assadi, D. Nguyen   +5 more
semanticscholar   +1 more source