Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy [PDF]
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties.
N. Balke+5 more
semanticscholar +2 more sources
Quantitative Electromechanical Atomic Force Microscopy. [PDF]
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine.
L. Collins+3 more
semanticscholar +6 more sources
Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy [PDF]
We have studied the dynamics of quartz tuning fork resonators used in atomic force microscopy taking into account mechanical energy dissipation through the attachment of the tuning fork base.
A. Castellanos-Gomez+22 more
core +2 more sources
Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb.
Daniel Platz+3 more
doaj +3 more sources
Magnetic-Dielectric Cantilevers for Atomic Force Microscopy [PDF]
Atomic force microscopy (AFM) is a technique that relies on detecting forces at the nanonewton scale. It involves using a cantilever with a tiny tip at one end. This tip interacts with the short- and long-range forces of material surfaces.
Gala Sanchez-Seguame+7 more
doaj +2 more sources
Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution.
Lulu Zhou+3 more
doaj +2 more sources
Noncontact atomic force microscopy [PDF]
Udo D. Schwarz
doaj +3 more sources
Bearingless Inertial Rotational Stage for Atomic Force Microscopy [PDF]
We introduce a novel rotational stage based on inertial motion, designed to be lightweight, compact, and fully compatible with atomic force microscopy (AFM) systems.
Eva Osuna+4 more
doaj +2 more sources
Advanced atomic force microscopy techniques V [PDF]
Philipp Rahe+5 more
doaj +2 more sources
Shale adhesion force measurements via atomic force microscopy
Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous ...
Mitiurev Nikolai+4 more
doaj +1 more source