Results 221 to 230 of about 17,310 (258)
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Automated optical inspection for holograms with mixed patterns
The International Journal of Advanced Manufacturing Technology, 2010This paper proposes an automated optical inspection system for holograms with mixed patterns. The hardware system consists of LED illuminator, CCD camera, and vision processor. The LEDs of illuminator emit alternatively and change the incident angle to acquire each pattern from hologram.
Hyuk-Joong Kwon, Tae-Hyoung Park
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The Impact of Automated Optical Inspection
SMTA International, 2000ABSTRACT Manufacturers of electronic circuit boards are being asked to produce more complex products at lower costs while meeting high quality and reliability standards. In order to achieve this, they must eliminate all non-value-added operations.
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Automated Optical BGA-Inspection – AUTOBIN
2011Today’s highly complex microelectronic integrated circuits require large numbers of electrical connections for power supply and signal input/ ouput. Ball Grid Arrays (BGA) have found a wide-spread use in microelectronic packaging, as they offer a large number of connections with advantageous electrical and thermal parameters.
D. Gnieser, R. Tutsch
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An optical Fourier/electronic neurocomputer automated inspection system
IEEE International Conference on Neural Networks, 1988An optical Fourier/electronic neurocomputer automated inspection system prototype is described. The system is composed to two modules: (1) a video-input optical/electronic Fourier feature extraction module, and (2) a PC/AT-based neurocomputer for feature signature (i.e., image) classification.
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Using distributed neural networks in automated optical inspection
24th International Spring Seminar on Electronics Technology. Concurrent Engineering in Electronic Packaging. ISSE 2001. Conference Proceedings (Cat. No.01EX492), 2002This paper introduces the concept of distributed neural networks over a computer network. Each layer in the neural network can be run as a separate application on different computers or on the same computer. The paper emphasizes the advantages of such an architecture over classical ones in terms of issues such as large neural networks and large input ...
C. Milea, P. Svasta
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Automated optical quality inspection of light emitting diodes
Measurement Science and Technology, 2006In this paper we describe a machine vision system for automatic optical quality inspection of light emitting diodes (LEDs). The proposed system is capable of measuring the intensity, mean colour, colour variation, divergence of the optical axis from the mechanical one and viewing angle of the emitted light.
Miran Bürmen +2 more
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Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering
2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020Neural networks have proven to be extraordinarily successful in many computer vision applications. But the approaches used to train neural networks require large datasets of annotated images, which requires a solid amount of human time to prepare those datasets.
Jan Lehr +4 more
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Automated optical filter measurement, inspection and mapping system
Optical Interference Coatings, 2004This paper describes an automated optical filter measuring, inspection and mapping system developed using a spectrophotometer, scanners, ink jet printing system and robot arm.
Kevin Mackrodt +5 more
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Position determination of a ball grid array by automated optical inspection method
The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS), 2014This paper introduces a novel automated optical inspection (AOI) method to measure the positions and diameters of micro-solder balls of a ball grid array (BGA). The method is focused on the refinement of optical configuration, image acquisition platform design to improve the time efficiency of AOI. We use a white LED ring as a light source.
Yi-Chuan Lin, Kerwin Wang
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Automated Optical Inspection of Printed Circuit Card Assemblies
Pan Pacific Symposium, 2000ABSTRACT The challenge of inspecting densely populated surface mount printed circuit cards in today's production environment is no small task. Manufacturing has typically relied on a combination of manual inspection and electrical testing to accomplish this task.
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