Results 1 to 10 of about 3,360,387 (243)
Доклады Белорусского государственного университета информатики и радиоэлектроники, 2020 Present work is devoted to determination the regularity of change of specific resistance and Schottky barrier height of nickel films on n-type silicon (111) at their rapid thermal treatment in the temperatures range from 200 to 550 °C.
Ja. A. Solovjov, V. A. Pilipenko
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Journal of New Results in Science, 2023 Diodes are exposed to radiation in many operating environments, and it is important to investigate the radiation effect. In this study, the impact of X-ray radiation on the electrical properties of Mo/Cu(In0.7Ga0.3)Te2/p-Si/Al semiconductor diode was ...
Güven Çankaya +2 more
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IEEE Access, 2022 The estimation of charge density distribution in polyethylene (PE) especially at the interface region with conducting material such as copper (Cu) is essential at high field conduction.
Mohammed El-Shahat, Hussein I. Anis
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Comment on ‘Physics-based representations for machine learning properties of chemical reactions’
Machine Learning: Science and Technology, 2023 In a recent article in this journal, van Gerwen et al (2022 Mach. Learn.: Sci. Technol. 3 045005) presented a kernel ridge regression model to predict reaction barrier heights.
Kevin A Spiekermann +3 more
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Sensors, 2023 The estimation of the characteristic parameters of the electrical contacts in CdZnTe and CdTe detectors is related to the identification of the main transport mechanisms dominating the currents.
Fabio Principato +3 more
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Investigation of barrier height distributions over the gate area of Al-SiO2-Si structures
Journal of Telecommunications and Information Technology, 2023 Distributions of the gate-dielectric EBG(x, y) and semiconductor-dielectric EBS(x, y) barrier height values have been determined using the photoelectric measurement method.
Krzysztof Piskorski +1 more
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Determination of energy barrier profiles for high-k dielectric materials utilizing bias-dependent internal photoemission [PDF]
, 2004 We utilize bias-dependent internal photoemission spectroscopy to determine the metal/dielectric/silicon energy barrier profiles for Au/HfO2/Si and Au/Al2O3/Si structures. The results indicate that the applied voltage plays a large role in determining the
Atwater, Harry A. +5 more
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Understanding Density-Driven Errors for Reaction Barrier Heights
Journal of Chemical Theory and Computation, 2023 Delocalization errors, such as charge-transfer and some self-interaction errors, plague computationally-efficient and otherwise-accurate density functional approximations (DFAs). Evaluating a semi-local DFA non-self-consistently on the Hartree-Fock (HF) density is often recommended as a computationally cheap remedy for delocalization errors.
Aaron D. Kaplan +4 more
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Accurate barrier heights using diffusion Monte Carlo [PDF]
The Journal of Chemical Physics, 2017 Fixed node diffusion Monte Carlo (DMC) has been performed on a test set of forward and reverse barrier heights for 19 non-hydrogen-transfer reactions, and the nodal error has been assessed. The DMC results are robust to changes in the nodal surface, as assessed by using different mean-field techniques to generate single determinant wave functions ...
Kittithat Krongchon +2 more
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Inhomogeneity in barrier height at graphene/Si (GaAs) Schottky junctions [PDF]
Nanotechnology, 2015 Graphene (Gr) interfaced with a semiconductor forms a Schottky junction with rectifying properties, however, fluctuations in the Schottky barrier height are often observed.
D. Tomer +4 more
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