Results 91 to 100 of about 534 (173)

Design and Development of an Optical Chip Interferometer For High Precision On-Line Surface Measurement

open access: yes
Advances in manufacturing and with the demand of achieving faster throughput at a lower cost in any industrial setting have put forward the need for embedded metrology.
Kumar, Prashant
core  

Observation of high-order quantum Pancharatnam-Berry phase with structured photons. [PDF]

open access: yesFundam Res
Huang SY   +8 more
europepmc   +1 more source

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