Results 81 to 87 of about 393 (87)
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An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults

Journal of Electronic Testing: Theory and Applications (JETTA), 2006
Tian Xia
exaly  

LT-RTPG: a new test-per-scan BIST TPG for low switching activity

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006
exaly  

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