Results 251 to 260 of about 1,320,249 (296)

Decoupling ionic defect energetics and electronic alignment in mixed conducting oxides

Siebenhofer M, Steinbach C, Kresse G, Fleig J.   +3 more
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Trapped fractional charges at bulk defects in topological insulators

Nature, 2021
Topological crystalline insulators (TCIs) can exhibit unusual, quantized electric phenomena such as fractional electric polarization and boundary-localized fractional charge1-6. This quantized fractional charge is the generic observable for identification of TCIs that lack clear spectral features5-7, including ones with higher-order topology8-11.
Gaurav Bahl, Taylor L Hughes, Wentao Jiang   +2 more
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Structural defects in bulk GaN

Journal of Crystal Growth, 2014
Abstract Transmission Electron Microscopy (TEM) studies of undoped and Mg doped GaN layers grown on the HVPE substrates by High Nitrogen Pressure Solution (HNPS) with the multi-feed-seed (MFS) configuration are shown. The propagation of dislocations from the HVPE substrate to the layer is observed. Due to the interaction between these dislocations in
Z. Liliental-Weber, R. dos Reis, M. Mancuso, C.Y. Song, I. Grzegory, S. Porowski, M. Bockowski   +6 more
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Bulk vs Surface Defects

2021
This chapter is dedicated to achieving complete and deep understanding why effective implementation of defective engineering cannot be realized without considering the most fundamental principles of materials design and their correlation with processes happened within crystal lattice.
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Bulk Buying of Possibly Defective Items

Journal of the Operational Research Society, 1984
Summary: The paper examines buying where faulty items are returned repeatedly until the entire order is obtained defect-free, as is typified by mail- order buying. The advantage of bulk buying is investigated theoretically both when the probability of being defective is assumed constant and when it is allowed to vary.
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Bulk Defect Chemistry of PCFC Cathode Materials: Discussion of Defect Interactions

ECS Meeting Abstracts, 2017
In order to extend the reactive zone for oxygen reduction to water beyond the gas/electrode/electrolyte three phase boundary, cathode materials for proton conducting ceramic fuel cells should exhibit a certain proton conductivity, exceeding 10-5 S/cm [1]. Proton uptake into (Ba,Sr,La)(Mn,Fe,Co)O3- d perovskites considered as cathode
Zohourian, R., Merkle, R., Maier, J.
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Hydrogen-related defects in bulk ZnO

MRS Proceedings, 2009
AbstractZinc oxide (ZnO) has attracted resurgent interest as an active material for energy-efficient lighting applications. An optically transparent crystal, ZnO emits light in the blue-to-UV region of the spectrum. The efficiency of the emission is higher than more “conventional” materials such as GaN, making ZnO a strong candidate for solid-state ...
Matthew D McCluskey, Slade J. Jokela, Marianne C. Tarun   +2 more
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Defects in hydrothermally grown bulk ZnO

Applied Physics Letters, 2007
Hydrothermally grown bulk ZnO (Tokyo Denpa) was investigated using junction-capacitance spectroscopy on silver oxide Schottky contacts (barrier height of 1.20eV, ideality factor of 1.04). Two main shallow defects, T1 and T2, with thermal activation energies of 13 and 52meV, respectively, were identified.
H. von Wenckstern, H. Schmidt, M. Grundmann, M. W. Allen, P. Miller, R. J. Reeves, S. M. Durbin   +6 more
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Effects of Surface and Bulk Defects in InP

MRS Proceedings, 1987
ABSTRACTUndoped, n-type InP has been studied utilizing Au-oxide- InP metal-insulator-semiconductor (MIS) structures. Processing variations have included oxide growth techniques, and annealing of grown oxides. Annealing of the devices in N2 or N2 :H2 after oxide formation has reduced reverse saturation current density by up to a factor of 10 and ...
C. Warren, K. Reinhardt, A. Singh, Y. S. Lee, W. A. Anderson   +4 more
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Bulk micro-defect detection with low-angle illumination

Review of Scientific Instruments, 2021
The detection of oxygen precipitates, voids, and other defects is critical for semiconductor wafer makers. One of the industry standard techniques for detecting these Bulk Micro-Defects (BMDs) is Semilab’s Light Scattering Tomograph (LST) system. In this measurement, unpatterned wafers are nominally cleaved in half. Illumination is applied to the front
T. Szarvas, G. Molnár, Gy. Nádudvari, Sz. Tóth, O. Almásy, Sz. Spindler, D. Erdei, Sz. Pothorszky, R. Kretschmer, S. Bauer   +9 more
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