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Structural Techniques for Bulk Defects Characterization

1982
This lecture considers briefly the most widely applied structural techniques for the characterization of crystal defects in silicon, like X-ray topography, transmission and scanning electron microscopy. Examples of defects analysis are reported concerning the characterization of the defects introduced by the phosphorous predeposition in Si and the ...
openaire   +1 more source

Hydrogen passivation of bulk defects

2021
Brett Hallam   +2 more
openaire   +1 more source

Improvement Performance of Planar Perovskite Solar Cells by Bulk and Surface Defect Passivation

ACS Sustainable Chemistry and Engineering, 2021
Cheng Mu, Zhichao Lin, Dongping Zhu
exaly  

Bulk Studies of Defects in Semiconductors

Materials Science Forum, 2001
openaire   +1 more source

Defect Formation Mechanism of Bulk SiC

Materials Science Forum, 1998
Makato Sasaki   +4 more
openaire   +1 more source

Understanding Effects of Defects in Bulk Cu2ZnSnS4 Absorber Layer of Kesterite Solar Cells

Solar Energy, 2020
Assiya Haddout   +2 more
exaly  

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