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Structural Techniques for Bulk Defects Characterization
1982This lecture considers briefly the most widely applied structural techniques for the characterization of crystal defects in silicon, like X-ray topography, transmission and scanning electron microscopy. Examples of defects analysis are reported concerning the characterization of the defects introduced by the phosphorous predeposition in Si and the ...
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Bulk defects and surface roughening in epitaxial growth
Physical Review B, 1995, Schimschak, , Krug
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Improvement Performance of Planar Perovskite Solar Cells by Bulk and Surface Defect Passivation
ACS Sustainable Chemistry and Engineering, 2021Cheng Mu, Zhichao Lin, Dongping Zhu
exaly
Defect Formation Mechanism of Bulk SiC
Materials Science Forum, 1998Makato Sasaki +4 more
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Understanding Effects of Defects in Bulk Cu2ZnSnS4 Absorber Layer of Kesterite Solar Cells
Solar Energy, 2020Assiya Haddout +2 more
exaly

