Results 1 to 10 of about 54,322 (165)

Ultra-High Light Extraction Efficiency and Ultra-Thin Mini-LED Solution by Freeform Surface Chip Scale Package Array

open access: yesCrystals, 2019
In this study, we present a novel type of package, freeform-designed chip scale package (FDCSP), which has ultra-high light extraction efficiency and bat-wing light field.
Che-Hsuan Huang   +9 more
doaj   +3 more sources

Signal Integrity Analysis of RF Probe Card for WLCSP Testing Using Polyimide-Based Grounded Coplanar Waveguide Transmission Lines

open access: yesIEEE Access, 2023
Wafer-level chip-scale packages have been extensively adopted in the electronic packaging industry owing to their ability to enhance device performance.
Tae Kyun Kim   +3 more
doaj   +1 more source

Thermal and magnetic field analysis of temperature control module for VCSEL chips

open access: yesCase Studies in Thermal Engineering, 2023
VCSEL chips with wavelengths in the range of 700 nm–800 nm, the same as the transition spectral lines of alkali atoms, can be used as light sources for novel miniaturized quantum sensors.
Dezhao Li   +5 more
doaj   +1 more source

Understanding and Improving Reliability for Wafer Level Chip Scale Package: A Study Based on 45nm RFSOI Technology for 5G Applications

open access: yesIEEE Journal of the Electron Devices Society, 2020
Wafer level chip scale package (WLCSP) is true chip scale package with low cost by eliminating package substrate. The direct chip-to-board attach through solder joints provides low interconnect inductance and resistance, as well as improved thermal ...
Zhuo-Jie Wu   +2 more
doaj   +1 more source

A Review of Design and Integration Technologies for D-Band Antennas

open access: yesIEEE Open Journal of Antennas and Propagation, 2021
This article reviews the current state-of-the-art of millimeter-wave (mm-wave) antennas for communication and sensing applications in the D-band between 110 and 170 GHz.
Martijn de Kok   +2 more
doaj   +1 more source

Development of Reliable, High Performance WLCSP for BSI CMOS Image Sensor for Automotive Application

open access: yesSensors, 2020
To meet the urgent market demand for small package size and high reliability performance for automotive CMOS image sensor (CIS) application, wafer level chip scale packaging (WLCSP) technology using through silicon vias (TSV) needs to be developed to ...
Tianshen Zhou   +4 more
doaj   +1 more source

ChIP-BIT2: a software tool to detect weak binding events using a Bayesian integration approach

open access: yesBMC Bioinformatics, 2021
Background ChIP-seq combines chromatin immunoprecipitation assays with sequencing and identifies genome-wide binding sites for DNA binding proteins. While many binding sites have strong ChIP-seq ‘peak’ observations and are well captured, there are still ...
Xi Chen   +5 more
doaj   +1 more source

Design and fabrication of cryogenic multiplexing control chip

open access: yesFrontiers in Physics, 2023
This paper presents a design and fabrication process of a cryogenic multiplexing control chip (MCC) for superconducting quantum computers. The working temperature of MCC can be 10 ∼ 30 mK, because it could be integrated with quantum processor in the same
Rutian Huang   +12 more
doaj   +1 more source

Challenges and recent prospectives of 3D heterogeneous integration

open access: yese-Prime: Advances in Electrical Engineering, Electronics and Energy, 2022
With the continuous reduction of chip feature size, the continuation of Moore's Law becomes increasingly difficult and heterogeneous integration has become one of the important orientations of electronic technology.
Shuye Zhang   +6 more
doaj   +1 more source

Solder Joint Reliability Modeling by Sequential Artificial Neural Network for Glass Wafer Level Chip Scale Package

open access: yesIEEE Access, 2020
This article combines the sequential artificial neural network (NN) machine learning with finite element (FE) modeling to assess the solder joint thermal cycling performance. A glass wafer-level chip-scale package (G-WLCSP) is used for this study.
Cadmus C. A. Yuan, Chang-Chi Lee
doaj   +1 more source

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