Results 11 to 20 of about 43,186 (267)

Systematic Design of a Pseudodifferential VCO Using Monomial Fitting

Elektronika ir Elektrotechnika, 2023
Digital integrated electronics benefits from its higher abstraction level, allowing optimisation methods and automated workflows. However, analogue integrated circuit design is still predominantly done manually, leading to lengthy design cycles.
Nicolai J. Dahl, Pere L. Muntal, Michael A. E. Andersen   +2 more
doaj   +1 more source

A CMOS Vector-Sum Phase Shifter for 5G mm-Wave Application [PDF]

Journal of Electromagnetic Engineering and Science, 2022
This paper presents a wideband CMOS vector-sum phase shifter (VSPS) targeting the n260 band of 5G communication. A differential quadrature generator is implemented using a Marchand balun and two 90° coupled-line couplers to improve robustness to process ...
Eunjung Kim, Younghwan Kim, Sanggeun Jeon   +2 more
doaj   +1 more source

Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

Sensors, 2016
SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging.
Neale A. W. Dutton, Istvan Gyongy, Luca Parmesan, Robert K. Henderson   +3 more
doaj   +1 more source

Miniaturization of CMOS [PDF]

Micromachines, 2019
When the international technology roadmap of semiconductors (ITRS) started almost five decades ago, the metal oxide effect transistor (MOSFET) as units in integrated circuits (IC) continuously miniaturized. The transistor structure has radically changed from its original planar 2D architecture to today’s 3D Fin field-effect transistors (FinFETs) along ...
Henry H. Radamson, Xiaobin He, Qingzhu Zhang, Jinbiao Liu, Hushan Cui, Jinjuan Xiang, Zhenzhen Kong, Wenjuan Xiong, Junjie Li, Jianfeng Gao, Hong Yang, Shihai Gu, Xuewei Zhao, Yong Du, Jiahan Yu, Guilei Wang   +15 more
openaire   +5 more sources

Node Monitoring as a Fault Detection Countermeasure against Information Leakage within a RISC-V Microprocessor

Cryptography, 2022
Advanced, superscalar microprocessors (μP) are highly susceptible to wear-out failures because of their highly complex, densely packed circuit structure and extreme operational frequencies. Although many types of fault detection and mitigation strategies
Donald E. Owen, Jithin Joseph, Jim Plusquellic, Tom J. Mannos, Brian Dziki   +4 more
doaj   +1 more source

Efficient transient simulation of efuse [PDF]

International Journal of Electronics and Telecommunications
This paper presents a novel approach to model efuse device. An efuse is a simple semiconductor device which can be referred to as a programmable resistor and is available in many modern CMOS technologies.
Zbigniew Jaworski
doaj   +1 more source

Gap solitons on an integrated CMOS chip

Nanophotonics, 2023
Nonlinear propagation in periodic media has been studied for decades, yielding demonstrations of numerous phenomena including strong temporal compression and slow light generation.
Choi Ju Won, Sohn Byoung-Uk, Sahin Ezgi, Chen George F. R., Xing Peng, Ng Doris K. T., Eggleton Benjamin J., Tan Dawn T. H.   +7 more
doaj   +1 more source

Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

Journal of Synchrotron Radiation, 2022
The latest Complementary Metal Oxide Semiconductor (CMOS) 2D sensors now rival the performance of state-of-the-art photon detectors for optical application, combining a high-frame-rate speed with a wide dynamic range.
Cyril Léveillé, Kewin Desjardins, Horia Popescu, Boris Vondungbo, Marcel Hennes, Renaud Delaunay, Emmanuelle Jal, Dario De Angelis, Matteo Pancaldi, Emanuele Pedersoli, Flavio Capotondi, Nicolas Jaouen   +11 more
doaj   +1 more source

Automotive 3.0 µm Pixel High Dynamic Range Sensor with LED Flicker Mitigation

Sensors, 2020
We present and discuss parameters of a high dynamic range (HDR) image sensor with LED flicker mitigation (LFM) operating in automotive temperature range.
Minseok Oh, Sergey Velichko, Scott Johnson, Michael Guidash, Hung-Chih Chang, Daniel Tekleab, Bob Gravelle, Steve Nicholes, Maheedhar Suryadevara, Dave Collins, Rick Mauritzson, Lin Lin, Shaheen Amanullah, Manuel Innocent   +13 more
doaj   +1 more source

Dynamic Power Consumption In CMOS N Bit Full-Adder Circuit [PDF]

Engineering and Technology Journal, 2021
This paper discusses power consumption in the full adder circuit using some fabrication technologies. Though many studies related to power consumption in the full adder circuit were performed, however, few investigations about the effect of the number of
Amal Hasan, Qusay Al-Doori
doaj   +1 more source