Results 1 to 10 of about 14,225,696 (298)

DIGITAL CONTACT POTENTIAL DIFFERENCE PROBE [PDF]

open access: yesПриборы и методы измерений, 2016
Nowadays the technique of analog contact potential difference probes well developed. Due to the influence of various parasitic factors, analog probes has substantial errors.
K. U. Pantsialeyeu   +3 more
doaj   +4 more sources

DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES [PDF]

open access: yesПриборы и методы измерений, 2016
The contact potential difference probes distinguished by great variety and produced mostly in the laboratory for specific experimental applications. As a rule, they consist of commercially available instrumentation, and have a number of disadvantages ...
K. U. Pantsialeyeu   +2 more
doaj   +4 more sources

Contact potential difference of alloy steel after heat treatment

open access: yesAdvanced Engineering Research, 2020
Introduction. The paper considers an actual issue of the development and application of a non-destructive method for controlling the quality of surfaces of steel products (Kelvin probe method).
L. P. Aref`eva   +3 more
doaj   +2 more sources

Revisiting contact potential difference in electrostatic force microscopy

open access: yesJournal of Physics Communications
Understanding the tip–substrate interaction in Electrostatic Force Microscopy (EFM) is essential for the quantitative analysis of experimental data. In this work, the role of the contact potential difference ( V _CPD ) between tip and substrate, both ...
Lukas Lehnert   +2 more
doaj   +3 more sources

Investigation of barrier height distributions over the gate area of Al-SiO2-Si structures

open access: yesJournal of Telecommunications and Information Technology, 2023
Distributions of the gate-dielectric EBG(x, y) and semiconductor-dielectric EBS(x, y) barrier height values have been determined using the photoelectric measurement method.
Krzysztof Piskorski   +1 more
doaj   +1 more source

Universal Digital Probe Electrometer for Testing Semiconductor Wafers

open access: yesПриборы и методы измерений, 2023
Non-contact electrical methods are widely used for research and control of semiconductor wafers. The methods are usually based on surface potential measurement (CPD) in combination with illumination and/or deposition of charges on the sample using a ...
A. L. Zharin   +3 more
doaj   +1 more source

Electron work function in individual multiwalled carbon nanotubes doped with nitrogen and boron [PDF]

open access: yesОмский научный вестник, 2020
Multi-walled undoped and doped with nitrogen and boron carbon nanotubes have been synthesized by chemical vapor deposition. Based on the analysis of images obtained by electrostatic force microscopy at various tip voltage, the value of the external ...
N. A. Davletkildeev   +3 more
doaj   +1 more source

DIGITAL CONTACT POTENTIAL PROBE IN STUDYING THE DEFORMATION OF DIELECTRIC MATERIALS

open access: yesInformatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska, 2020
The paper reviews the results of a study on the surface electrostatic charges of dielectrics obtained using the contact potential difference (CPD) technique.
Kanstantsin Pantsialeyeu   +6 more
doaj   +1 more source

Corrosion Resistance of 904L Super Austenitic Stainless Steel Welded Joints [PDF]

open access: yesCailiao Baohu, 2023
In order to study the corrosion resistance of 904L super austenitic stainless steel welded joints in a simulated nuclear power plant tertiary loop water environment, the Kelvin probe force microscope (KPFM), electron backscatter diffraction (EBSD ...
LIAO Xuebo, ZHANG Dubao, PU Jingjing, GAO Chao
doaj   +1 more source

Exciton Transfer at Heterointerfaces of MoS2 Monolayers and Fluorescent Molecular Aggregates

open access: yesAdvanced Science, 2022
Integration of distinct materials to form heterostructures enables the proposal of new functional devices based on emergent physical phenomena beyond the properties of the constituent materials.
Soyeong Kwon   +12 more
doaj   +1 more source

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