Results 1 to 10 of about 83,045 (156)

Theoretical total harmonic distortion evaluation based on digital to analogue converter mismatch to improve the linearity of successive approximation register analogue to digital converter

open access: yesIET Circuits, Devices and Systems, 2022
Mismatch in the binary‐weighted capacitive digital‐to‐analog converter (DAC) greatly affects the linearity of the successive‐approximation‐register (SAR) ADC by deteriorating the total harmonic distortion (THD).
Li Dong   +8 more
doaj   +1 more source

Asynchronous SAR ADC with self‐timed track‐and‐hold

open access: yesElectronics Letters, 2023
This paper presents an asynchronous SAR ADC featuring a self‐timed track‐and‐hold (STH) architecture. The design aims to address the common timing issue of divider‐based clock generation, where the fixed‐time track‐and‐hold (FTH) period often results in ...
Sunghyun Bae   +4 more
doaj   +1 more source

A novel bandgap voltage reference based on folding compensation

open access: yesElectronics Letters, 2023
This letter proposes a novel bandgap reference circuit that utilizes both curvature and folding compensation to achieve a temperature coefficient (TC) of 2.23 ppm/°C.
Mingyu Liu   +4 more
doaj   +1 more source

Method of high timing resolution pulse synthesis based on virtual sampling [PDF]

open access: yesMetrology and Measurement Systems, 2022
Adjustable-width pulse signals are widely used in systems such as test equipment for hold time, response time and radar testing. In this study, we proposed a pulse generation method based on virtual sampling with ultra-high pulse width resolution. In the
Hanglin Liu   +4 more
doaj   +1 more source

A 1.2V −55°C‐125°C ultra‐low noise bandgap voltage reference without start‐up circuit

open access: yesElectronics Letters, 2023
This paper proposes a novel bandgap voltage reference (BGR) with low temperature coefficient, ultra‐low noise and without start‐up circuit. Designed in a TSMC 180‐nm CMOS technology, this bandgap voltage reference operates in the temperature range of −55
Linzhi Tao, Haoyu Zhuang, Qiang Li
doaj   +1 more source

A neural network based background calibration for pipelined‐SAR ADCs at low hardware cost

open access: yesElectronics Letters, 2023
This paper proposes a background calibration scheme for the pipelined‐Successive Approximation Register (SAR) Analog‐to‐Digital Converter (ADC) based on the neural network.
Yuguo Xiang   +5 more
doaj   +1 more source

An optical digital‐to‐analog converter with a built‐in intensity converter consisting of silicon waveguide

open access: yesIET Optoelectronics, 2023
Optical digital‐to‐analog converters (DACs) are key to overcoming the enormous power consumption caused by the slowdown of Moore's Law. In previous work, an optical DAC consisting of a signal generator and an intensity converter was presented.
Yohei Aikawa, Hiroyuki Uenohara
doaj   +1 more source

A low‐power and area‐efficient ultrasound receiver using beamforming successive approximation register analog‐to‐digital converter with capacitive digital‐to‐analog converter combined delay cell structure for 3‐D imaging systems

open access: yesElectronics Letters, 2022
The authors present a low‐power area‐efficient subarray beamforming receiver (RX) structure for a miniaturized 3‐D ultrasound imaging system. Given that the delay‐and‐sum (DAS) and digitization functions consume most of the area and power in the receiver,
Seungah Lee, Soohyun Yun, Joonsung Bae
doaj   +1 more source

A capacitor mismatch calibration scheme for SAR ADC based on genetic algorithm

open access: yesElectronics Letters, 2023
Capacitor mismatch problem due to process variation causes weight error, which deteriorates the linearity of SAR ADC. In this paper, a novel calibration scheme based on genetic algorithm(GA) combined with a radix‐less‐than‐2 SAR ADC is proposed to ...
Yujia Huang   +4 more
doaj   +1 more source

11 b 200 MS/s 28‐nm CMOS 2b/cycle successive‐approximation register analogue‐to‐digital converter using offset‐mismatch calibrated comparators

open access: yesElectronics Letters, 2023
This letter presents an 11 b 200 MS/s 28 nm CMOS 2b/cycle successive‐approximation register (SAR) analogue‐to‐digital converter (ADC). The offset calibration technique is proposed to reduce the comparator offset mismatch that degrades the linearity of ...
Jaehyuk Lee   +9 more
doaj   +1 more source

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