Results 231 to 240 of about 1,067,462 (345)

Machine Learning‐Based Estimation of Experimental Artifacts and Image Quality in Fluorescence Microscopy

open access: yesAdvanced Intelligent Systems, Volume 7, Issue 3, March 2025.
The use of image quality metrics in combination with machine learning enables automatic image quality assessment for fluorescence microscopy images. The method can be integrated into the experimental pipeline for optical microscopy and utilized to classify artifacts in experimental images and to build quality rankings with a reference‐free approach ...
Elena Corbetta, Thomas Bocklitz
wiley   +1 more source

From Single Sensors to Sensor Arrays: Leveraging Supervised Machine Learning to Read Multiple Soft Capacitive Sensors with a Single Pair of Wires

open access: yesAdvanced Intelligent Systems, EarlyView.
The study presents a method for detecting touch location and force magnitude on soft capacitive sensors without complex electrode patterning. Multifrequency impedance measurements are combined with machine learning to accurately classify five sensing zones and estimate applied force with low error.
Samuel Belk   +3 more
wiley   +1 more source

Soft Robots Proprioception Through Stretchable Laser‐Induced Graphene Strain Sensors

open access: yesAdvanced Intelligent Systems, EarlyView.
This study demonstrates the potential of laser‐induced graphene and silicone sensors for soft pneumatic grippers’ proprioception. The sensors are thin, stretchable, mechanically transparent, and easy to integrate. Finite‐element method analysis identifies the finger's neutral bending plane and four sensor positions are tested to validate the ...
Giovanna De Luca   +6 more
wiley   +1 more source

Dual Neural Network Framework with SPICE Integration for Fast and Accurate Transistor Modeling

open access: yesAdvanced Intelligent Systems, EarlyView.
Neural network (NN)‐based compact transistor models are often deployed and evaluated standalone due to the lack of compatibility with existing simulation program with integrated circuit emphasis (SPICE) software. Herein, the proposed dual‐NN framework with the best trade‐off between high speed and high accuracy is integrated into commercial SPICE ...
Rodion Novkin, Hussam Amrouch
wiley   +1 more source

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