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Dopants, defects and diffusion
Physics World, 1995Silicon is the driving force behind the information superhighway, multimedia and all the other much-hyped trends that have suddenly been noticed by the media in the past two years. This information revolution has been made possible by the phenomenal advances in the manufacture of silicon-based integrated circuits.
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Novel Organic Superbase Dopants for Ultraefficient N‐Doping of Organic Semiconductors
Advanced Materials, 2023Tong Wu, Zebing Zeng, Yuan-Yuan Hu
exaly
1984
The developments necessary to implement a comprehensive research programme aimed at understanding dopant incorporation in silicon are described. The two experimental techniques used, and possessing the required dynamic range and depth resolution, are high resolution Spreading Resistance and Secondary Ion Mass Spectrometry.
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The developments necessary to implement a comprehensive research programme aimed at understanding dopant incorporation in silicon are described. The two experimental techniques used, and possessing the required dynamic range and depth resolution, are high resolution Spreading Resistance and Secondary Ion Mass Spectrometry.
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Dopant Diffusion and Segregation
1988In a defect-free, single-crystal of silicon, dopant impurities diffuse into the perfect lattice structure by interacting with point defects, such as silicon vacancies and interstitials. In addition to the point defects in which exist in equilibrium with the crystal lattice, the point-defect concentration can also be influenced externally (eg, by ...
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Random Dopant Fluctuation (RDF)
2016Following Moore’s Law (Moore in Progress in digital integrated electronics. In: IEDM technical digest, pp 11–13, 1975, [1], semiconductor industries have doubled the density of transistors in integrated circuits (ICs) every two years. This has rapidly increased the performance of ICs because the degree of integration has grown exponentially.
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