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Impact of cilia length and variable fluid properties on electroosmotic nanofluid flow in an inclined converging microchannel. [PDF]

Sci Rep
Sadalagi P, Choudhari R, Vaidya H, Gudekote M, Prasad KV.   +4 more
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Coupled Electro-Thermal Simulation of MOSFETs

ASME 2009 InterPACK Conference, Volume 1, 2009
Thermal transport in metal-oxide-semiconductor field effect transistors (MOSFETs) due to electron-phonon scattering is simulated using phonon generation rates obtained from an electron Monte Carlo device simulation. The device simulation accounts for a full band description of both electrons and phonons considering 22 types of electron-phonon ...
Chunjian Ni, Zlatan Aksamija, Jayathi Y. Murthy, Umberto Ravaioli   +3 more
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Fully coupled dynamic electro-thermal simulation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1997
Fully coupled dynamic electro-thermal simulation on chip and circuit level is presented. Temperature dependent thermal conductivity of silicon is taken into account, thus solving the nonlinear heat diffusion equation. The numerical solution is carried out by using the industry-standard simulator SABER, therefore for electro-thermal simulations we are ...
G. Digele, S. Lindenkreuz, E. Kasper
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Electro-thermal circuit simulation using simulator coupling

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1997
The paper presents a methodology for simulating the static and dynamic performance of integrated circuits in the presence of electro-thermal interactions on the integrated circuit die. The technique is based on the coupling of a finite element method (FEM) program with a circuit simulator.
S. Wunsche, C. Clauss, P. Schwarz, F. Winkler   +3 more
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Coupled electro-thermal modeling and optimization of clock networks

Microelectronics Journal, 2003
In this paper a coupled electro-thermal model is used for the optimal design of the clock distribution tree of a high performance microprocessor. Such approach allows simultaneously to take into account both thermal and electrical constraints. In particular timing issues such as clock delay from the root of the tree to the leaves and skew between the ...
CASU, MARIO ROBERTO, GRAZIANO, MARIAGRAZIA, MASERA, Guido, PICCININI, GIANLUCA, ZAMBONI, Maurizio   +4 more
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Multiscale Coupled Electro-Thermal Simulations of Electron Devices

2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 2018
We present here a fully coupled flux-based electro-thermal simulation package. We simulate the electrical characteristics using a full-band Cellular Monte Carlo approach (CMC), which calculates the heat generation rate within each computational cell directly from the energy exchanged through electron-phonon scattering events.
Ky Merrill, Marco Saraniti
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Fully-Coupled Electro-Thermal Power Device Fields

2016
This paper presents a new solution method to deal with thermal effects in power designs. The new ingredients are: (1) the treatment of the electric and thermal fields are done fully self-consistent, (2) the dealing with (fragments of) the transistor fingers by using table models.
Wim Schoenmaker, Olivier Dupuis, Bart De Smedt, Peter Meuris   +3 more
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Electro-Thermally Coupled Power Optimization for Future Transistors

2007 65th Annual Device Research Conference, 2007
We have developed a self-consistent, electro-thermally coupled, total power, (includes dynamic, DP, and static leakage power, SDL) optimization methodology for future transistors. It calculates the best power-delay tradeoff curve, and the corresponding self-consistent, temperature-delay curves for a given transistor from its current-voltage ...
A. K. Chao, P. Kapur, Eiji Morifuji, K. C. Saraswat, Y. Nishi   +4 more
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Electro-thermal coupled analysis of MOSFET under IEMI

2018 International Applied Computational Electromagnetics Society Symposium - China (ACES), 2018
Analysis of MOSFET under intentionally electromagnetic interferences (IEMIs) has been taken by using the self-developed electro-thermal software since this external interferences have been blamed for unexplained breakdowns and burnouts of many vulnerable electronic circuits and systems.
Yong Li, Haiyan Xie, Jianguo Wang
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Three dimemsional electro-thermal coupled Monte Carlo device simulation

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2014
3D paralleled electro-thermal coupled full band ensemble MC simulation platform is developed for analysis of local heating effect on performance and reliability of semiconductor devices. This new developed simulation platform provides a powerful tool for thermal-aware device and circuit design of nano scale devices.
Xiaoyan Liu, Kangliang Wei, Longxiang Yin, Gang Du, Hai Jiang, Kai Zhao, Lang Zeng, Xing Zhang   +7 more
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