Results 241 to 250 of about 31,810 (274)

Comparative Morphological Signatures of Strike Ordered Uranium Oxides for Nuclear Forensics. [PDF]

open access: yesACS Omega
Meigs NJ   +5 more
europepmc   +1 more source

Electron holography by planar electron backscattered diffraction patterns

Journal of the Optical Society of America A, 2021
Since Dennis Gabor introduced holography in 1948, it has been of interest to apply it to atomic scales. Electrons with high kinetic energies may indeed be used for electron holography. We describe the holographic process with electron backscatter diffraction (EBSD) as a non-invasive surface structure analysis. We show that typical parameters of current
Matthias, Gianfelice, Carsten, Westphal
openaire   +2 more sources

Energy-filtered electron backscatter diffraction

Ultramicroscopy, 2008
The electron backscatter diffraction (EBSD) analytical technique is invaluable for determining the crystallography of bulk alloys, thin films, and nanoparticles. However, our physical understanding of EBSD pattern generation is incomplete, which hinders our ability to push the limits of EBSD analysis. Here, using an energy filter with better than 10 eV
Andrew, Deal   +2 more
openaire   +2 more sources

Quantifying recrystallization by electron backscatter diffraction

Journal of Microscopy, 2004
SummaryThe use of high‐resolution electron backscatter diffraction in the scanning electron microscope to quantify the volume fraction of recrystallization and the recrystallization kinetics is discussed. Monitoring the changes of high‐angle grain boundary (HAGB) content during annealing is shown to be a reliable method of determining the volume ...
H, Jazaeri, F J, Humphreys
openaire   +2 more sources

Electron Backscatter Diffraction

2019
Electron backscatter diffraction (EBSD) is a scanning electron microscope (SEM) based technique that is used to obtain local information on the crystallographic character of bulk crystalline and polycrystalline materials. Topics discussed in this article include: EBSD system overview, multiphase analysis, and application to aluminum integrated circuit ...
David P. Field, Mukul Kumar
openaire   +1 more source

Bragg's Law diffraction simulations for electron backscatter diffraction analysis

Ultramicroscopy, 2009
In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice rotations and elastic strains to high resolution. A variation of the cross-correlation method is introduced using Bragg's Law-based simulated EBSD patterns as strain free reference patterns that ...
Josh, Kacher   +3 more
openaire   +2 more sources

Electron backscatter diffraction: applications for nuclear materials

Journal of Microscopy, 1999
The diffraction of electrons was first observed in 1928 by Kikuchi. The phenomenon results in the formation of characteristic diagrams of the crystalline lattice and the orientation of the phase. Backscattered electrons are diffracted by the different crystallographic planes (hkl) according to the Bragg angle θb.
, Medevielle, , Hugon, , Dugne
openaire   +2 more sources

Orientation averaging of electron backscattered diffraction data

Journal of Microscopy, 2001
The use of data averaging to improve the angular precision of electron backscattered diffraction (EBSD) maps is discussed. It is shown that orientations may be conveniently and rapidly averaged using the four Euler‐symmetric parameters which are coefficients of a quaternion representation.
F J, Humphreys, P S, Bate, P J, Hurley
openaire   +2 more sources

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