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Measuring Strains Using Electron Backscatter Diffraction

2000
The electron backscatter diffraction (EBSD) technique has undergone significant development in recent years. The technique is most widely used for crystal orientation measurement, however, it also provides a powerful tool for phase discrimination (identification) and strain analysis. This chapter reviews the application of EBSD to the analysis of local
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Electron BackScatter Diffraction method

JOURNAL OF THE JAPAN WELDING SOCIETY, 2016
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Theoretical Framework for Electron Backscatter Diffraction

2000
The ability to obtain microstructure-level orientation information, known generically as microtexture, requires that the probe size available from the exploring radiation must be smaller than the size of the microstructural units themselves. Electrons are ideal for such combined microstructural/crystallographic studies and indeed until the 1980s ...
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