Results 241 to 250 of about 32,553 (288)

Energy-filtered electron backscatter diffraction

Ultramicroscopy, 2008
The electron backscatter diffraction (EBSD) analytical technique is invaluable for determining the crystallography of bulk alloys, thin films, and nanoparticles. However, our physical understanding of EBSD pattern generation is incomplete, which hinders our ability to push the limits of EBSD analysis. Here, using an energy filter with better than 10 eV
Andrew, Deal, Tejpal, Hooghan, Alwyn, Eades   +2 more
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Quantifying recrystallization by electron backscatter diffraction

Journal of Microscopy, 2004
SummaryThe use of high‐resolution electron backscatter diffraction in the scanning electron microscope to quantify the volume fraction of recrystallization and the recrystallization kinetics is discussed. Monitoring the changes of high‐angle grain boundary (HAGB) content during annealing is shown to be a reliable method of determining the volume ...
H, Jazaeri, F J, Humphreys
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Electron Backscatter Diffraction

2019
Electron backscatter diffraction (EBSD) is a scanning electron microscope (SEM) based technique that is used to obtain local information on the crystallographic character of bulk crystalline and polycrystalline materials. Topics discussed in this article include: EBSD system overview, multiphase analysis, and application to aluminum integrated circuit ...
David P. Field, Mukul Kumar
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Bragg's Law diffraction simulations for electron backscatter diffraction analysis

Ultramicroscopy, 2009
In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice rotations and elastic strains to high resolution. A variation of the cross-correlation method is introduced using Bragg's Law-based simulated EBSD patterns as strain free reference patterns that ...
Josh, Kacher, Colin, Landon, Brent L, Adams, David, Fullwood   +3 more
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Electron backscatter diffraction: applications for nuclear materials

Journal of Microscopy, 1999
The diffraction of electrons was first observed in 1928 by Kikuchi. The phenomenon results in the formation of characteristic diagrams of the crystalline lattice and the orientation of the phase. Backscattered electrons are diffracted by the different crystallographic planes (hkl) according to the Bragg angle θb.
, Medevielle, , Hugon, , Dugne
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Orientation averaging of electron backscattered diffraction data

Journal of Microscopy, 2001
The use of data averaging to improve the angular precision of electron backscattered diffraction (EBSD) maps is discussed. It is shown that orientations may be conveniently and rapidly averaged using the four Euler‐symmetric parameters which are coefficients of a quaternion representation.
F J, Humphreys, P S, Bate, P J, Hurley
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Multivariate statistical approach to electron backscattered diffraction

Ultramicroscopy, 2008
This paper assesses the potential of multivariate statistical analysis (MSA) applied to electron backscattered diffraction (EBSD) data. Instead of directly indexing EBSD patterns on an individual basis, this multivariate approach reduces a large (thousands) set of individual EBSD patterns into a core set of statistically derived component EBSD patterns
Luke N, Brewer, Paul G, Kotula, Joseph R, Michael   +2 more
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Quantitative metallography by electron backscattered diffraction

Journal of Microscopy, 1999
Although electron backscattered diffraction (EBSD) in the scanning electron microscope is used mainly to investigate the relationship between local textures and microstructures, the technique has now developed to the stage where it requires serious consideration as a tool for routine quantitative characterization of microstructures. This paper examines
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Electron backscatter diffraction and cracking

Materials Science and Technology, 2002
Abstract Electron backscatter diffraction (EBSD) is now a well developed technique that allows for determination of 'microtexture', i.e. texture at the scale of the grain size. The effect of the local crystallographic properties on microscopic and macroscopic cracking resistance was studied in a large number of materials.
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Electron Backscatter Diffraction

2018
Electron backscatter diffraction patterns (EBSD patterns) can be used to determine the orientation of the crystal lattice. Principle of EBSD pattern is similar to Kikuchi pattern observed in transmission electron microscope (TEM). In the case of scanning electron microscope (SEM), when an electron beam enters a highly tilted crystalline material, it is
openaire   +1 more source