Results 21 to 30 of about 296,316 (315)
A cross-sectional transmission electron microscopy study of iron recovered from a laser-heated diamond anvil cell [PDF]
, 2008 This paper discusses the use of a focused ion beam for the preparation of cross-sectional transmission electron microscopy specimens from small samples, typically 150 micron in diameter, that have been recovered from a laser-heated diamond anvil cell. We
Greaves, Graeme +3 more
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Two-step hybrid process of movable part inside glass substrate using ultrafast laser
Micro and Nano Systems Letters, 2021 We demonstrate a two-step hybrid process for fabricating movable parts inside glass substrate using the selective laser-induced etching (SLE) process that is consisted of laser-direct writing and wet chemical etching.
Jeongtae Kim +4 more
doaj +1 more source
Composition formulas of solid-solution alloys derived from chemical-short-range orders
Scientific Reports, 2022 Solid solutions are the basis for most industrial alloys. However, the relationships between their characteristic short-range orders and chemical compositions have not been established.
Zhuang Li +5 more
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High-Speed Focus Inspection System Using a Position-Sensitive Detector
Sensors, 2017 Precise and rapid focus detection is an essential operation in several manufacturing processes employing high-intensity lasers. However, the detection resolution of existing methods is notably low.
Binh Xuan Cao +5 more
doaj +1 more source
Micromachines, 2022 This study proposes a rapid and inexpensive thermocycler that enables rapid heating of samples using a thin glass chip and a cheap chip resistor to overcome the on-site diagnostic limitations of polymerase chain reaction (PCR). Microchip PCR devices have
Dongsun Yeom +6 more
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Electron-beam spectroscopy for nanophotonics [PDF]
Nature Materials, 2019 Progress in electron-beam spectroscopies has recently enabled the study of optical excitations with combined space, energy and time resolution in the nanometer, millielectronvolt and femtosecond domain, thus providing unique access into nanophotonic structures and their detailed optical responses.
Albert Polman +2 more
openaire +3 more sources
Sensors, 2017 In modern high-intensity ultrafast laser processing, detecting the focal position of the working laser beam, at which the intensity is the highest and the beam diameter is the lowest, and immediately locating the target sample at that point are ...
Binh Xuan Cao +5 more
doaj +1 more source
Electron Energy Spectrometer for MIR-THz FEL Light Source at Chiang Mai University
Particles, 2023 The linear accelerator system of the PBP-CMU Electron Linac Laboratory has been designed with the aim of generating free-electron lasers (FELs) in the mid-infrared (MIR) and terahertz (THz) regions.
Kittipong Techakaew +2 more
doaj +1 more source
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2005 20 pages, 5 ...
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Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling [PDF]
, 2006 Thinning specimens to electron transparency for electron microscopy analysis can be done by conventional (2 - 4 kV) argon ion milling or focused ion beam (FIB) lift-out techniques.
Smith, W. +6 more
core +1 more source