Results 201 to 210 of about 841,718 (266)

DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy. [PDF]

open access: yesCell Rep Methods
Medina N   +7 more
europepmc   +1 more source

Measurement of atomic scattering factors by cryo-electron microscopy

open access: yes
Shtyrov A   +11 more
europepmc   +1 more source

MorphoLearn: A morphology-driven workflow to decipher 3D electron microscopy segmentation in diatoms

open access: yes
Uwizeye C   +6 more
europepmc   +1 more source

Electronic detectors for electron microscopy

Quarterly Reviews of Biophysics, 2011
AbstractElectron microscopy (EM) is an important tool for high-resolution structure determination in applications ranging from condensed matter to biology. Electronic detectors are now used in most applications in EM as they offer convenience and immediate feedback that is not possible with film or image plates.
A R, Faruqi, G, McMullan
openaire   +2 more sources

Home - About - Disclaimer - Privacy