DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy. [PDF]
Medina N +7 more
europepmc +1 more source
The return of a forgotten ally: tabletop scanning electron microscopy in the realm of bacteriology. [PDF]
Zmerli O +3 more
europepmc +1 more source
Correction for Wildenberg et al., Photoemission electron microscopy for connectomics. [PDF]
europepmc +1 more source
vEMINR: Ultra-Fast Isotropic Reconstruction for Volume Electron Microscopy With Implicit Neural Representation. [PDF]
Yang J +7 more
europepmc +1 more source
In Situ Scanning Transmission Electron Microscopy/Transmission Electron Microscopy Study of Defect-Driven Ag Ion Dynamics and Filament Evolution in CuO Nanowire-Based Memristors. [PDF]
Hung CH, Chi CC, Hsiao KY, Lu MY.
europepmc +1 more source
Measurement of atomic scattering factors by cryo-electron microscopy
Shtyrov A +11 more
europepmc +1 more source
MorphoLearn: A morphology-driven workflow to decipher 3D electron microscopy segmentation in diatoms
Uwizeye C +6 more
europepmc +1 more source

