Electrostatic tip-dielectric sample interaction in electrostatic force microscopy
Revista Facultad de Ingeniería Universidad de Antioquia, 2013 Electric force microscopy is a local technique for measuring electrical properties of materials. The electrostatic force gradient measurements on dielectric samples are sensitive not only to the initial charge distribution in the sample but also to the ...
Ariel Gómez +2 more
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Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination [PDF]
Beilstein Journal of Nanotechnology, 2011 The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar +5 more
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Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy [PDF]
Physical Review B, 2010 In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions near the surface ...
D. Sarid +5 more
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Analysis of Ionic Domains on a Proton Exchange Membrane Using a Numerical Approximation Model Based on Electrostatic Force Microscopy. [PDF]
Polymers (Basel), 2021 Son B, Park J, Kwon O.
europepmc +3 more sources
Electrostatic Discovery Atomic Force Microscopy
ACS Nano, 2021 While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electrostatic Discovery Atomic Force Microscopy, a machine learning based method which provides immediate ...
Niko Oinonen +9 more
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Quantum Transport and Molecular Sensing in Reduced Graphene Oxide Measured with Scanning Probe Microscopy [PDF]
MoleculesWe report combined scanning probe microscopy and electrical measurements to investigate local electronic transport in reduced graphene oxide (rGO) devices.
Julian Sutaria, Cristian Staii
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Probing the dopant profile in nanoscale devices by low temperature electrostatic force microscopy
AIP Advances, 2019 Probing dopant distributions in nanoscale devices may find important applications in failure analysis. In this work, we employed cryogenic electrostatic force microscopy (EFM) to probe the dopant distribution in a lateral nanoscale bipolar junction ...
Wanqing Wang +4 more
doaj +2 more sources
Next MaterialsThe tunable work function of titanium dioxide (TiO2) nanoparticles of various sizes was measured using the Kelvin Probe Force Microscopy (KPFM) technique.
Ishaq Musa +3 more
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Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation [PDF]
Physical Review Applied, 2015 We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requires no low frequency modulation.
Yoichi Miyahara +3 more
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Enhanced electrostatic force microscopy reveals higher-order DNA looping mediated by the telomeric protein TRF2. [PDF]
Sci Rep, 2016 Kaur P +8 more
europepmc +3 more sources