AIP Advances, 2020 We use a new method based on Electrostatic Force Microscopy (EFM) to perform quantitative measurements of the dielectric constants of individual carboxylated as well as non-functionalized polystyrene nanospheres. The EFM data record the oscillation phase
Marc Descoteaux +2 more
doaj +1 more source
Applied Microscopy, 2021 Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand
Young-Min Kim +4 more
doaj +1 more source
Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy [PDF]
, 1999 We have studied molecular beam epitaxy grown GaN films of both polarities using electric force microscopy to detect sub 1 µm regions of charge density variations associated with GaN extended defects.
Bandić, Z. Z. +3 more
core +1 more source
Calculating electrostatic interactions in atomic force microscopy with semiconductor samples
AIP Advances, 2019 Electrostatic interactions are important in non-contact atomic force microscopy (AFM) measurement. Previous reports had focused on the calculation of electrostatic interactions in AFM with metal and dielectric samples, and the present work extended the ...
Jie Xu, Jinze Li, Wei Li
doaj +1 more source
Effects of Long-Range Tip-Sample Interaction on Magnetic Force Imaging: A Comparative Study Between Bimorph Driven System and Electrostatic Force Modulation [PDF]
, 2012 Magnetic force microscopy (MFM) using electrostatic force modulation has been designed and developed to avoid the drawbacks of the bimorph driven system.
Kim, Byung I.
core +2 more sources
Electric charge enhancements in carbon nanotubes: Theory and experiments [PDF]
, 2008 We present a detailed study of the static enhancement effects of electric charges in micron-length single-walled carbon nanotubes, using theoretically an atomic charge-dipole model and experimentally electrostatic force microscopy.
J. D. Jackson +4 more
core +2 more sources
Electrostatic Force Microscopy Measurement System for Micro-topography of Non-conductive Devices
Measurement Science Review, 2018 A home-made electrostatic force microscopy (EFM) system is described which is directed toward assessment of the microscopic geometry of the surface of specimens made of non-conductive material with a large thickness. This system is based on the variation
He Gaofa +3 more
doaj +1 more source
High–low Kelvin probe force spectroscopy for measuring the interface state density
Beilstein Journal of Nanotechnology, 2023 The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
doaj +1 more source
Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy [PDF]
, 2010 We have developed a method for imaging the temperature-frequency dependence of the dynamics of nanostructured polymer films with spatial resolution. This method provides images with dielectric compositional contrast well decoupled from topography.
de Knijff, P. +11 more
core +4 more sources
Measuring the effect of electrostatic patch potentials in Casimir force experiments
Physical Review Research, 2020 The Casimir force is a consequence of quantum electrodynamic fluctuations, which induce interactions between materials. Patch potentials (i.e., spatial variations of electrostatic potentials across a surface) are a concern in measurements of the Casimir ...
Joseph L. Garrett +2 more
doaj +1 more source