Results 11 to 20 of about 149,709 (288)

Quantum Transport and Molecular Sensing in Reduced Graphene Oxide Measured with Scanning Probe Microscopy [PDF]

Molecules
We report combined scanning probe microscopy and electrical measurements to investigate local electronic transport in reduced graphene oxide (rGO) devices.
Julian Sutaria, Cristian Staii
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Electrostatic Discovery Atomic Force Microscopy

ACS Nano, 2021
While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electrostatic Discovery Atomic Force Microscopy, a machine learning based method which provides immediate ...
Xu, Chen, Alldritt, Benjamin, Canova, Filippo Federici, Urtev, Fedor, Cai, Shuning, Krejčí, Ondřej, Kannala, Juho, Liljeroth, Peter, Foster, Adam S., Hapala, Hapala, Oinonen, Niko   +11 more
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Atomic force microscopy in energetic materials research: A review

Energetic Materials Frontiers, 2022
Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva, Alla N. Pivkina, Nikita V. Muravyev   +2 more
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Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation [PDF]

Physical Review Applied, 2015
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requires no low frequency modulation.
Miyahara, Yoichi, Topple, Jessica, Schumacher, Zeno, Grutter, Peter   +3 more
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Structural, Atomic and Electrostatic Force Microscopy Analyses on YBCO/PBCO/LCMO Superlattices [PDF]

Materials Research, 2017
In order to study the influence of the insulator layer thickness in heterojunctions, (YBa2Cu3O7-δ[20nm]/ PrBa2Cu3Oy/La1/3Ca2/3MnO3[20nm])x20 superlattices were prepared by pulsed laser deposition using three PrBa2Cu3Oy layer thicknesses and two different
Marcel Miyamura Bonilha, Dayse Iara dos Santos, Nelcy Della Santina Mohallem, Luciana Moreira Seara, Anne Hitomi Yonamine   +4 more
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Minimizing electrostatic interactions from piezoresponse force microscopy via capacitive excitation

Theoretical and Applied Mechanics Letters, 2020
Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been increasingly recognized that piezoresponse measured by PFM is often influenced by electrostatic ...
Qingfeng Zhu, Ehsan Nasr Esfahani, Shuhong Xie, Jiangyu Li   +3 more
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Quantitative electrostatic force measurement and characterization based on oscillation amplitude using atomic force microscopy

AIP Advances, 2020
Measurement of electrostatic force at the micro-/nanoscale has a great scientific value and engineering significance. This paper develops a new determination method of electrostatic forces based on Kelvin probe force mode in atomic force microscopy (AFM).
Kesheng Wang, Yijia Lu, Jia Cheng, Xiaoying Zhu, Linhong Ji   +4 more
doaj   +1 more source

Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields [PDF]

, 2001
Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction ...
Ferrier, R.P., Gallagher, A., McVitie, S., Scott, J.   +3 more
core   +1 more source

Electric force microscopy of induced charges and surface potentials in GaN modified by light and strain [PDF]

, 1999
We have studied molecular beam epitaxy grown GaN films using electric force microscopy to detect sub-1 µm regions of electric field gradient and surface potential variations associated with GaN extended defects.
Bandić, Z. Z., Bridger, P. M., McGill, T. C., Piquette, E. C.   +3 more
core   +1 more source

Electrostatic-free piezoresponse force microscopy

Scientific Reports, 2017
AbstractContact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus,
Sungho Kim, Daehee Seol, Xiaoli Lu, Marin Alexe, Yunseok Kim   +4 more
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