The detection of buried nanopillar based on electrostatic force microscopy simulation
AIP Advances, 2022 Based on electrostatic force microscopy (EFM), the image of nano-objects buried below the surface was numerically simulated by using COMSOL Multiphysics® software.
Yongzhen Luo +3 more
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Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2020 Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz +2 more
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Electrostatic force spectroscopy of near-surface localized states [PDF]
, 2004 Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a semiconductor.
Dana, Aykutlu, Yamamoto, Yoshihisa
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Unambiguous interpretation of atomically resolved force microscopy images of an insulator [PDF]
, 2001 The (111) surface of CaF 2 was imaged with dynamic mode scanning force microscopy and modeled using atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern ...
Barth, C. +3 more
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Nanoscale Advances, 2022 Electrostatic forces complicate the interpretation of piezoresponse force microscopy (PFM). Electrostatic blind spot (ESBS) PFM overcomes these complications by placing the detection laser where it is sensitive piezoresponse but not electrostatics.
Jason P. Killgore +2 more
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Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques [PDF]
Омский научный вестник, 2018 Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined.
D. V. Sokolov +2 more
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Scanning Probe Spectroscopy of WS2/Graphene Van Der Waals Heterostructures
Nanomaterials, 2020 In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. In particular, we have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional scanning ...
Franco Dinelli +5 more
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Analysis of amplitude modulation atomic force microscopy in aqueous salt solutions [PDF]
, 2014 Cataloged from PDF version of article.We present a numerical analysis of amplitude modulation atomic force microscopy in aqueous salt solutions, by considering the interaction of the microscope tip with a model sample surface consisting of a hard ...
Baykara, M. Z., Karayaylali, P.
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Nonlinear analysis of Electrostatic Force Microscopy
AIP Conference Proceedings, 2003 In a search to control charge injection and detection with an atomic force microscope, dynamic force curves are investigated in the presence of an electrostatic tip‐sample coupling. An analytical study, using a plane capacitor model, provides results in good agreement with experimental data, in particular for the hysteretic behavior of the tip ...
Dianoux, R. +5 more
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Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy [PDF]
, 2010 In order to measure the dielectric permittivity of thin insulting layers, we developed a method based on electrostatic force microscopy (EFM) experiments coupled with numerical simulations.
Alegría, Angel +8 more
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