Dynamic electrostatic force microscopy in liquid media
Applied Physics Letters, 2013 We present the implementation of dynamic electrostatic force microscopy in liquid media. This implementation enables the quantitative imaging of local dielectric properties of materials in electrolyte solutions with nanoscale spatial resolution.
Edwards, M. A. +3 more
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Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy. [PDF]
Scanning, 2017 Nanocomposites physical properties unexplainable by general mixture laws are usually supposed to be related to interphases, highly present at the nanoscale. The intrinsic dielectric constant of the interphase and its volume need to be considered in the prediction of the effective permittivity of nanodielectrics, for example.
El Khoury D +8 more
europepmc +4 more sources
The use of artificial neural networks in electrostatic force microscopy. [PDF]
Nanoscale Res Lett, 2012 Castellano-Hernández E +4 more
europepmc +3 more sources
Atomic force microscopy in energetic materials research: A review
Energetic Materials Frontiers, 2022 Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva +2 more
doaj +1 more source
Quantitative phase‐mode electrostatic force microscopy on silicon oxide nanostructures [PDF]
Journal of Microscopy, 2020 SummaryPhase‐mode electrostatic force microscopy (EFM‐Phase) is a viable technique to image surface electrostatic potential of silicon oxide stripes fabricated by oxidation scanning probe lithography, exhibiting an inhomogeneous distribution of localized charges trapped within the stripes during the electrochemical reaction.
Cristiano Albonetti +6 more
openalex +6 more sources
Structural, Atomic and Electrostatic Force Microscopy Analyses on YBCO/PBCO/LCMO Superlattices [PDF]
Materials Research, 2017 In order to study the influence of the insulator layer thickness in heterojunctions, (YBa2Cu3O7-δ[20nm]/ PrBa2Cu3Oy/La1/3Ca2/3MnO3[20nm])x20 superlattices were prepared by pulsed laser deposition using three PrBa2Cu3Oy layer thicknesses and two different
Marcel Miyamura Bonilha +4 more
doaj +1 more source
Minimizing electrostatic interactions from piezoresponse force microscopy via capacitive excitation
Theoretical and Applied Mechanics Letters, 2020 Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been increasingly recognized that piezoresponse measured by PFM is often influenced by electrostatic ...
Qingfeng Zhu +3 more
doaj +1 more source
Electrostatic force spectroscopy of near-surface localized states [PDF]
, 2004 Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a semiconductor.
Dana, Aykutlu, Yamamoto, Yoshihisa
core +2 more sources
Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy [PDF]
, 1999 We have studied molecular beam epitaxy grown GaN films of both polarities using electric force microscopy to detect sub 1 µm regions of charge density variations associated with GaN extended defects.
Bandić, Z. Z. +3 more
core +1 more source
Electrostatic-free piezoresponse force microscopy
Scientific Reports, 2017 AbstractContact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus,
Sungho Kim +4 more
openaire +2 more sources