Unambiguous interpretation of atomically resolved force microscopy images of an insulator [PDF]
, 2001 The (111) surface of CaF 2 was imaged with dynamic mode scanning force microscopy and modeled using atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern ...
Barth, C. +3 more
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The detection of buried nanopillar based on electrostatic force microscopy simulation
AIP Advances, 2022 Based on electrostatic force microscopy (EFM), the image of nano-objects buried below the surface was numerically simulated by using COMSOL Multiphysics® software.
Yongzhen Luo +3 more
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Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2020 Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz +2 more
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Analysis of amplitude modulation atomic force microscopy in aqueous salt solutions [PDF]
, 2014 Cataloged from PDF version of article.We present a numerical analysis of amplitude modulation atomic force microscopy in aqueous salt solutions, by considering the interaction of the microscope tip with a model sample surface consisting of a hard ...
Baykara, M. Z., Karayaylali, P.
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Nanoscale Advances, 2022 Electrostatic forces complicate the interpretation of piezoresponse force microscopy (PFM). Electrostatic blind spot (ESBS) PFM overcomes these complications by placing the detection laser where it is sensitive piezoresponse but not electrostatics.
Jason P. Killgore +2 more
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Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques [PDF]
Омский научный вестник, 2018 Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined.
D. V. Sokolov +2 more
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Scanning Probe Spectroscopy of WS2/Graphene Van Der Waals Heterostructures
Nanomaterials, 2020 In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. In particular, we have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional scanning ...
Franco Dinelli +5 more
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Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields [PDF]
, 2001 Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction ...
Ferrier, R.P. +3 more
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Nonlinear analysis of Electrostatic Force Microscopy
AIP Conference Proceedings, 2003 In a search to control charge injection and detection with an atomic force microscope, dynamic force curves are investigated in the presence of an electrostatic tip‐sample coupling. An analytical study, using a plane capacitor model, provides results in good agreement with experimental data, in particular for the hysteretic behavior of the tip ...
Dianoux, R. +5 more
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Calculating electrostatic interactions in atomic force microscopy with semiconductor samples
AIP Advances, 2019 Electrostatic interactions are important in non-contact atomic force microscopy (AFM) measurement. Previous reports had focused on the calculation of electrostatic interactions in AFM with metal and dielectric samples, and the present work extended the ...
Jie Xu, Jinze Li, Wei Li
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