Results 41 to 50 of about 148,798 (321)
AIP Advances, 2020 We use a new method based on Electrostatic Force Microscopy (EFM) to perform quantitative measurements of the dielectric constants of individual carboxylated as well as non-functionalized polystyrene nanospheres. The EFM data record the oscillation phase
Marc Descoteaux +2 more
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Applied Microscopy, 2021 Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand
Young-Min Kim +4 more
doaj +1 more source
Electric force microscopy of induced charges and surface potentials in GaN modified by light and strain [PDF]
, 1999 We have studied molecular beam epitaxy grown GaN films using electric force microscopy to detect sub-1 µm regions of electric field gradient and surface potential variations associated with GaN extended defects.
Bandić, Z. Z. +3 more
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Electric charge enhancements in carbon nanotubes: Theory and experiments [PDF]
, 2008 We present a detailed study of the static enhancement effects of electric charges in micron-length single-walled carbon nanotubes, using theoretically an atomic charge-dipole model and experimentally electrostatic force microscopy.
J. D. Jackson +4 more
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Electrostatic Force Microscopy Measurement System for Micro-topography of Non-conductive Devices
Measurement Science Review, 2018 A home-made electrostatic force microscopy (EFM) system is described which is directed toward assessment of the microscopic geometry of the surface of specimens made of non-conductive material with a large thickness. This system is based on the variation
He Gaofa +3 more
doaj +1 more source
High–low Kelvin probe force spectroscopy for measuring the interface state density
Beilstein Journal of Nanotechnology, 2023 The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
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Removal of electrostatic artifacts in magnetic force microscopy by controlled magnetization of the tip: application to superparamagnetic nanoparticles [PDF]
, 2016 Magnetic force microscopy (MFM) has been demonstrated as valuable technique for the characterization of magnetic nanomaterials. To be analyzed by MFM techniques, nanomaterials are generally deposited on flat substrates, resulting in an additional ...
ANGELONI, LIVIA +4 more
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Measuring the effect of electrostatic patch potentials in Casimir force experiments
Physical Review Research, 2020 The Casimir force is a consequence of quantum electrodynamic fluctuations, which induce interactions between materials. Patch potentials (i.e., spatial variations of electrostatic potentials across a surface) are a concern in measurements of the Casimir ...
Joseph L. Garrett +2 more
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Photoelectrical Properties Investigated on Individual Si Nanowires and Their Size Dependence
Nanoscale Research Letters, 2021 Periodically ordered arrays of vertically aligned Si nanowires (Si NWs) are successfully fabricated with controllable diameters and lengths. Their photoconductive properties are investigated by photoconductive atomic force microscopy (PCAFM) on ...
Xiaofeng Hu +3 more
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Electrostatic force microscopy of self‐assembled peptide structures
Scanning, 2011 AbstractIn this report electrostatic force microscopy (EFM) is used to study different peptide self‐assembled structures such as tubes and particles. It is shown that not only geometrical information can be obtained using EFM, but also information about the composition of different structures.
Casper Hyttel, Clausen +6 more
openaire +2 more sources