Results 91 to 100 of about 2,962,395 (163)
The tunable work function of titanium dioxide (TiO2) nanoparticles of various sizes was measured using the Kelvin Probe Force Microscopy (KPFM) technique.
Ishaq Musa +3 more
doaj +1 more source
Contact less electrostatic force microscopy (EFM) and dielectric force microscopy (DFM) are demonstrated to be very powerful tools of characterizing the electronic properties of individual single-walled carbon nanotubes (SWCNTs). Taking the advantages of
Zhang, Kang +2 more
core +1 more source
Scanning probe microscopy for optoelectronic characterization at the nanoscale [PDF]
Cataloged from PDF version of article.Includes bibliographical references leaves 58-60.In this work, we propose methods for electrical characterization of nanostructured surfaces using electrostatic force and tunneling current measurements in scanning
Ürel, Mustafa
core
In electrostatic force microscopy (EFM), a conductive atomic force microscopy (AFM) tip is electrically biased against a grounded sample and electrostatic forces are investigated.
Souier T +4 more
core +1 more source
In this study, nickel-doped titanium dioxide (Ni/TiO _2 ) thin films with varying nickel concentrations (0, 2, and 7 at%) were synthesized using the sol–gel dip-coating technique and deposited onto Si(001) substrates.
Dounia Adnane +5 more
doaj +1 more source
The Anti-Flyaway/Frizz Effect by Inducing the α-Helical Structure Transition of Hair
In order to reduce chronic hair flyaways/frizz, both reducing and oxidizing agents have to be used, leaving aside the hair damage issues. This study presents changes in hair morphology caused by treatment with a shampoo containing only reducing agents ...
Sang-Hun Song +2 more
doaj +1 more source
A new method for high-resolution analyses of hair surface charge density under ambient conditions is presented in this paper. Electrostatic force microscopy (EFM) is used here to analyze changes in surface charge density in virgin hair, bleached hair ...
Paskocimas, C. A. +19 more
core +1 more source
Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy
Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode.
Gomila Lluch, Gabriel +4 more
core +1 more source
Single-particle detection of enhanced polarizability in Au-decorated semiconducting nanorods <i>via</i> scanning dielectric microscopy. [PDF]
Millan-Solsona R +7 more
europepmc +1 more source
Layer-by-layer deposition of polyelectrolyte assemblies on crop seeds as a platform for active ingredient loading and controlled release. [PDF]
Rudich K +5 more
europepmc +1 more source

