Results 81 to 90 of about 2,962,395 (163)

Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields [PDF]

, 2001
Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction ...
Scott, J., Ferrier, R.P., Gallagher, A., McVitie, S.   +3 more
core   +1 more source

Structural, electrostatic force microscopy, work function, and optical characterization of pure and Al-doped ZnO nanoparticles

Results in Materials
The electrical and optical characteristics of pure and Al-doped zinc oxide (ZnO) nanoparticles were analyzed. The work function of these nanoparticles was investigated using Kelvin Probe Force Microscopy (KPFM).
Ishaq Musa, Randa Faqi
doaj   +1 more source

EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative [PDF]

, 2013
We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the ...
Elliott, Martin, Lilliu, Samuele, Maragliano, C., Stefancich, M., MacDonald, John Emyr, Hampton, Mark David, Chiesa, M., Dahlem, M. S., Lilliu Samuele, Maragliano Carlo, Chiesa M, MacDonald John Emyr, Elliott Martin, Dahlem Marcus S, Hampton Mark, Stefancich Marco   +15 more
core   +1 more source

Quantitative Mapping of Nano-Dielectrics with Electrostatic Force Microscopy

, 2010
International audiencee present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy by means of the double pass method.
Riedel, C., Schwartz, G. A., Lévêque, Gaëtan, Colmenero, J., Arinero, Richard, Tordjeman, Philippe, Alegria, A.   +6 more
core   +1 more source

Exploiting the interaction area limitation in Electrostatic Force Microscopy for dielectric measurements of nanoparticles

Micro and Nano Engineering
Electrostatic Force Microscopy (EFM) is widely used to determine the dielectric constant of 3D-nanostructures. Achieving quantitative results often requires complex Finite Element Method(FEM)-simulations, is limited by topographic crosstalk and tip ...
Lukas Lehnert, Lars Helgest, Benjamin Baumann, Anna Musyanovych, Eddy Kunnen, Ronald Thoelen, Hildegard Möbius   +6 more
doaj   +1 more source

Deep learning-assisted ultrafast ferroelectric domain imaging using atomic force microscopy

npj Computational Materials
Piezoresponse force microscopy (PFM), a lock-in-based mode of atomic force microscopy (AFM), enables sensitive ferroelectric domain imaging. However, fast imaging for either massive measurements or studying fast dynamic behavior remains challenging ...
Jaeuk Sung, Hongseok Kim, Jangwoo Ko, Panithan Sriboriboon, Dong-Gyu Lee, Sanghyun Jo, Hee Han, Jungho Ryu, Woo Lee, Jinseong Heo, Hyun-Cheol Song, Yunseok Kim   +11 more
doaj   +1 more source

Variable frequency and quantitative capacitance measurements in dual bias modulation electrostatic force microscopy [PDF]

Electrostatic force microscopy (EFM) has been used to investigate the local electronic properties of materials, although frequency response and quantitative capacitance measurements are difficult in conventional EFM because of its narrow measurement ...
フクザワ, リョウタ, Takahashi, Takuji, 福澤, 亮太, Fukuzawa, Ryota   +3 more
core   +2 more sources

Impact of surface electric properties of carbon-based thin films on platelets activation for nano-medical and nano-sensing applications

International Journal of Nanomedicine, 2008
Varvara Karagkiozaki1,2, Stergios Logothetidis1, Sylvie Lousinian1, George Giannoglou21Physics Department, Laboratory for Thin Films – Nanosystems and Nanometrology (LTFN); 2Medical School, AHEPA University General Hospital, 1st Cardiology ...
Varvara Karagkiozaki, Stergios Logothetidis, Sylvie Lousinian, George Giannoglou   +3 more
doaj  

KP-EFM measurements of surface potential and work function of doped graphene

, 2013
The electronic properties of graphene sheets have recently attracted much experimental and theoretical interest. A single graphene layer is a semimetal or zero-gap semiconductor, and has excellent electronic properties, such as high mobility (200 000 cm2
GBruno, MMGiangregorio, MLosurdo, GVBianco, PCapezzuto   +4 more
core  

Covalently Functionalized Metallic Single-Walled Carbon Nanotubes Studied Using Electrostatic Force Microscopy and Dielectric Force Microscopy

, 2016
Contactless electrostatic force microscopy (EFM) and dielectric force microscopy (DFM) are demonstrated to be very powerful tools of characterizing the electronic properties of individual single-walled carbon nanotubes (SWCNTs).
Nicola Marzari (1300560), Kang Zhang (24496), Qing Zhang (1802)   +2 more
core   +1 more source