Results 61 to 70 of about 2,962,395 (163)

Resonance‐Enhanced Four‐Wave Mixing Imaging for Mapping Defect Regions in Vanadium‐Doped WS2 Monolayers

Small Methods, Volume 10, Issue 19, 7 October 2026.
Resonant four‐wave mixing (FWM) microscopy reveals a spatial modulation of the third‐order nonlinear optical response in vanadium‐doped WS2 monolayers. This robust nonlinear contrast technique tracks the preferential accumulation of vanadium dopants along the structural bisection lines of the synthesized flakes.
Felipe Menescal, Frederico B. Sousa, Mingzu Liu, Ana P. M. Barboza, Igor F. Curvelo, Matheus J. S. Matos, Da Zhou, Bernardo R. A. Neves, Helio Chacham, Mauricio Terrones, Bruno R. Carvalho, Leandro M. Malard   +11 more
wiley   +1 more source

Nanometer scale x-ray absorption spectroscopy and chemical states mapping of ultra thin oxides on silicon using electrostatic force microscopy

, 2007
Electrostatic force microscopy (EFM) was used to obtain highly spatially resolved spectroscopic and image information of semiconductor surface region. EFM with x-ray source (X-EFM) can probe x-ray induced photoionization of near surface electron trapping.
M. Ishii, B. Hamilton, De Gendt, S., N. R. J. Poolton, Ishii, M., S. De Gendt, Rigopoulos, N., Poolton, N. R J, N. Rigopoulos, K. Sakurai, Hamilton, B., Sakurai, K.   +11 more
core   +1 more source

Nanoscale Spatial Tuning of Superconductivity in Cuprate Thin Films via Direct Laser Writing

Advanced Functional Materials, Volume 36, Issue 78, 28 September 2026.
Maskless direct laser writing enables local control of oxygen stoichiometry in epitaxial YBCO thin films under ambient conditions. Sub‐micrometer grayscale patterns with tunable optical response and superconducting transport properties are achieved.
Irene Biancardi, Valerio Levati, Jordi Alcalà, Thomas Günkel, Nicolas Lejeune, Riccardo Girelli, Alejandro V. Silhanek, Valeria Russo, Narcís Mestres, Daniela Petti, Anna Palau, Edoardo Albisetti   +11 more
wiley   +1 more source

Multi‐Level Saturation Current Encoding in Two‐Dimensional Ferroelectric Source‐Gated Transistors

Advanced Functional Materials, Volume 36, Issue 76, 21 September 2026.
A 2D ferroelectric source‐gated transistor (SGT) operates with a non‐volatile, multi‐level saturation current controlled by ferroelectric polarization. Operando electrostatic and photocurrent imaging link the current limitation to source‐side depletion, identifying saturation current as a programmable, read‐bias‐tolerant device parameter toward low ...
Joon‐Seok Kim, Ting‐Ching Chu, Zhehao Zhu, Lincoln J. Lauhon   +3 more
wiley   +1 more source

Electrostatic Force Microscopy of Self Assembled Peptide Structures

, 2011
In this report electrostatic force microscopy (EFM) is used to study different peptide self-assembled structures, such as tubes and particles. It is shown that not only geometrical information can be obtained using EFM, but also information about the ...
Spyros Pantoleon Panagos, Anna Mitraki, Dimaki, Maria, Mitrakli, Anna, Casper Hyttel Clausen, Winnie Edith Svendsen, Kasotakis, Emmanouil, Svendsen, Winnie Edith, Emmanouil Kasotakis, Jaime Castillo-León, Castillo, Jaime, Maria Dimaki, Clausen, Casper Hyttel, Pantagos, Spyros P.   +13 more
core   +1 more source

Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Materials Research Express
Many surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc In this paper, electrostatic force microscopy (EFM) and Kelvin probe force ...
Zonghua Qin, Xin Nie, Wenbin Yu, Shuguang Yang, Zongke Zhou, Shuqin Yang, Quan Wan   +6 more
doaj   +1 more source

Tunable atomic force microscopy bias lithography on electron beam induced carbonaceous platforms

AIP Advances, 2013
Tunable local electrochemical and physical modifications on the carbonaceous platforms are achieved using Atomic force microscope (AFM) bias lithography.
Narendra Kurra
doaj   +1 more source

Kelvin Probe Force Microscopy in Bionanotechnology: Current Advances and Future Perspectives

Advanced Materials, Volume 38, Issue 51, 11 September 2026.
Kelvin probe force microscopy (KPFM) enables the nanoscale mapping of electrostatic surface potentials. While widely applied in materials science, its use in biological systems remains emerging. This review presents recent advances in KPFM applied to biological samples and provides a critical perspective on current limitations and future directions for
Ehsan Rahimi, Mario Palacios‐Corella, Arjan Mol, Salvador Pané, Josep Puigmartí‐Luis   +4 more
wiley   +1 more source

Probing the structure of nanochannal arrays by electrostatic force microscopy

, 2012
Electrostatic force microscopy (EFM) represents a versitile tool for the characterisation of electric and dielectric structures at nanoscale which can be employed to provide charge distributions associated with such nanotopologies.
Murugaraj, P, Jakubov, T, Kumar, N, Siegele, R, Mainwaring, DE   +4 more
core  

Logic Functionality and Circuit Design of In2Se3‐Based Split‐Gate Ferroelectric Field‐Effect Transistor for Zero‐Trust Applications

Advanced Electronic Materials, Volume 12, Issue 17, 7 September 2026.
ABSTRACT Van der Waals ferroelectric materials are emerging as key building blocks for future logic devices and integrated circuits. Among them, α‐In2Se3 offers a unique combination of robust room temperature ferroelectricity and semiconducting behavior.
Ankita Ram, Cédric Marchand, Shehr Bano Masood, Aymen Mahmoudi, Takashi Taniguchi, Kenji Watanabe, Bernard Doudin, Abdelkarim Ouerghi, Ian O'Connor, Alexei Gruverman, Jean‐François Dayen   +10 more
wiley   +1 more source