Results 61 to 70 of about 2,263 (164)
Beilstein Journal of Nanotechnology, 2018 Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample.
Yue Shen +5 more
doaj +1 more source
The Importance of Cantilever Dynamics in the Interpretation of Kelvin Probe Force Microscopy [PDF]
, 2012 A realistic interpretation of the measured contact potential difference (CPD) in Kelvin probe force microscopy (KPFM) is crucial in order to extract meaningful information about the sample.
Brown, Keith A. +2 more
core +1 more source
Advanced Materials Interfaces, Volume 13, Issue 6, 16 March 2026.This Review proposes an interface‐centric framework for large‐area 2D materials integration, linking wafer‐scale single‐crystal epitaxy, clean transfer and deterministic stacking, and interface‐dominated structure–property–device correlations. We summarize how interfacial symmetry and energetics govern nucleation/coalescence and adhesion‐controlled ...
Han Chen +4 more
wiley +1 more source
Revista Facultad de Ingeniería Universidad de Antioquia, 2017 Ti6Al4V ELI (ASTM F136) alloy is one of the most used alloys in devices forosteosynthesis and joint replacement. However, the properties of this alloy can be improvedregarding biocompatibility and the osteointegration with the bone tissue through ...
Sara María Leal-Marin +1 more
doaj +1 more source
Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes
, 2000 We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multi-walled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon ...
A. Bachtold +34 more
core +1 more source
Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy [PDF]
, 2012 This is the author’s version of a work that was accepted for publication in Journal of Physics: Condensed Matter. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control ...
Castellano-Hernández, Elena +3 more
core +2 more sources
Advanced Optical Materials, Volume 14, Issue 11, 20 March 2026.This work reports the first observation of long‐range synchronized photoluminescence blinking in vapor‐grown, fully inorganic CsPbBr3 microcrystals, extending over 10 µm. The observations contradict supertrap‐based models and link blinking to Pb‐rich growth conditions. A new mechanism is established, in which hole diffusion mediates collective electron–
Noam Veber +11 more
wiley +1 more source
Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies
, 2002 Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques for the characterization of electrical properties at small dimensions.
Bonnell, Dawn A. +3 more
core +1 more source
Advanced Energy Materials, Volume 16, Issue 12, 25 March 2026.A scalable, anti‐solvent‐free crystallization strategy combining oleylamine‐assisted seed priming and vacuum processing is introduced. Molecularly defined α‐phase seeds direct vertical perovskite crystal growth, producing uniform monolithic films over large areas. The resulting modules achieve high certified efficiency and exceptional long‐term outdoor
Sun‐Ju Kim +24 more
wiley +1 more source
Imaging the charge transport in arrays of CdSe nanocrystals
, 2003 A novel method to image charge is used to measure the diffusion coefficient of electrons in films of CdSe nanocrystals at room temperature. This method makes possible the study of charge transport in films exhibiting high resistances or very small ...
Bawendi, M. G. +6 more
core +1 more source