Results 51 to 60 of about 2,962,395 (163)
Nitrogen‐stitched rGO forms an active charge‐regulating bilayer on graphite that pre‐adsorbs, guides, and delivers Li+ into the lattice. This adsorption–migration–diffusion pathway accelerates Li+ transport, stabilizes the interface, and enables fast‐charging performance beyond conventional graphite limits.
Hojun Moon +6 more
wiley +1 more source
Atomic‐scale structurally locked 1T/2H‐MoS2/ZnS direct Z‐scheme heterojunction enabling dual‐functional photocatalysis. The metallic 1T‐MoS2 phase serves as an electronic actuator that bridges charge transfer across the heterointerface, resulting in prolonged charge kinetics, efficient hydrogen evolution, and complete degradation of Malachite Green ...
Jeongjin Lee +10 more
wiley +1 more source
Quantitative electrostatic force microscopy-phase measurements
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) technique used to measure electrostatic force gradient.
Macdonald, JE +7 more
core +1 more source
The influence of porosity and infill pattern (architecture) on the mechanical and acoustic properties of FFF‐printed PLA is investigated. Ultrasonic analysis highlights the dominant role of interlayer porosity, revealing anisotropic behavior and a transition in elastic properties with increasing porosity.
Makki Ajmi +4 more
wiley +1 more source
Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample.
Yue Shen +5 more
doaj +1 more source
40 years of measuring properties with atomic force microscopy
Abstract This paper gives a short personal retrospective of some of the AFM methods developed in the Grutter group. It gives an overview of methods developed with the aim of measuring properties with high spatial and temporal resolution. Frequency mode AFM has over the past 40 years developed into a spatially resolving technique allowing spectroscopy ...
Peter Grutter
wiley +1 more source
Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy
We studied the charge storage and subsequent imaging of silicon quantum dots (SiQD) embedded in a $\chem{SiO_2}$ film by using atomic-force microscopy (AFM) in tapping and electrostatic force microscopy (EFM) modes.
P. Budau +9 more
core +1 more source
ABSTRACT In recent years, there has been an increasing demand to digitize production processes. In order to obtain the necessary data for these processes, numerous sensors must be installed on or in the machines. This can be difficult, especially when done retroactively, as the existing installation space must be able to accommodate the sensors.
Johannes D.M. Menning +5 more
wiley +1 more source
Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy [PDF]
We present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy (EFM) by means of the double pass method. The EFM experiments are based on the measurement of the frequency
Riedel, C. +21 more
core +1 more source
Ti6Al4V ELI (ASTM F136) alloy is one of the most used alloys in devices forosteosynthesis and joint replacement. However, the properties of this alloy can be improvedregarding biocompatibility and the osteointegration with the bone tissue through ...
Sara María Leal-Marin +1 more
doaj +1 more source

