Results 121 to 130 of about 24,227 (270)
Large area crystalline silicon solar cells fabricated on ultra‐thin (80 μ$$ \upmu $$m) Si wafer featuring polysilicon‐based passivating contacts on both sides can further increase the energy output per unit weight. In this work, the large area, screen‐printed solar cells with high temperature fire‐through contacts, yielded an exceptional efficiency‐to ...
Yuchi Lan +5 more
wiley +1 more source
Thin Fluoride Insulators for Improved 2D Transistors: From Deposition Methods to Recent Applications
2D materials hold significant promise for next‐generation electronic and optoelectronic devices, but suitable gate dielectrics are still a challenge. Fluoride insulators, offering inert, dangling‐bond‐free surfaces, have recently emerged as strong candidates. This review covers recent publications on high‐quality fluoride thin‐film deposition and their
Behzad Dadashnia +3 more
wiley +1 more source
Detection of avian influenza virus subtype H5 using a biosensor based on imaging ellipsometry
A novel method is reported for the detection of avian influenza virus subtype H5 using a biosensor based on high spatial resolution imaging ellipsometry (IE).
Yan JH +8 more
core +1 more source
ABSTRACT The controlled removal of corrosion products is a persistent challenge in fields ranging from industrial alloy protection to cultural heritage conservation. Achieving high precision and selectivity in subtractive treatments remains difficult because of chemical complexity and structural heterogeneity of the corrosion layers.
Yumei Chai +5 more
wiley +1 more source
Closed Loop Control of a Plasma Nitriding Process by Spectroscopic Ellipsometry
1 Introduction Nitriding is a well-established process for the surface hardening of steel parts. On the nitrided part a compound layer, containing iron nitrides is distinguished from a diffusion layer, containing only interstitial nitrogen.
Störi, Herbert +3 more
core
Spectroscopic ellipsometry for photovoltaics
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of ...
Collins, Robert, Fujiwara, Hiroyuki
core +1 more source
A freestanding polymer metasurface is developed to enhance light emission from atomically thin semiconductors. By supporting higher‐order optical resonances that concentrate electromagnetic fields at the surface, the platform significantly improves coupling between light and WS2 monolayer.
Chih‐Zong Deng +10 more
wiley +1 more source
Definitions and conventions in ellipsometry
Abstract Many parameters which appear in the theory of ellipsometry crucially depend on the choice of arbitrary conventions and definitions. This dependence is discussed for nine two-fold choices. On the basis of literature usage, preferences are expressed for one of each of the alternatives and for the nomenclature of the variables involved.
openaire +2 more sources
TIRE and SPR-enhanced SE for adsorption processes
Ellipsometry configurations in internal reflection mode facilitate studies of adsorption processes without the light beam passing through the medium from which adsorption accurs.
Arwin, Hans,
core
This study demonstrates the effectiveness of in situ UV−vis coupled with automated data analysis, namely, ATLAS, for fast and reliable identification of multiple thermal transition in conjugated polymer thin films. This ATLAS method will significantly accelerate the understanding of the phase behavior of D‐A polymers with important implications for ...
Doan Vu +6 more
wiley +1 more source

