Cellular Uptake of Nanoparticles is Regulated by Integrin-Based Adhesion to the Extracellular Matrix. [PDF]
Joshi S +5 more
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Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV-Vis-NIR Transmittance Spectrum. [PDF]
Minkov D +7 more
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Materials Informatics Framework for Accelerated Discovery of High-Refractive-Index 2D Materials. [PDF]
Klimova LA +6 more
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Ultrafast Formation of Jahn-Teller Polarons Revealed by State-Selective Excitation in Correlated Spinel Co<sub>3</sub>O<sub>4</sub>. [PDF]
Restelli S +25 more
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Structural, optical and electrical properties of Si-rich and N-rich PECVD silicon nitride films. [PDF]
Moussi TA +7 more
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Protein microarray biosensors based on imaging ellipsometry techniques and their applications [PDF]
After years of development, biosensors based on imaging ellipsometry and biosensors based on total internal reflection imaging ellipsometry have been successfully implemented in various engineering systems. Their experimental setups, detection principles,
Yu Niu, Jin Gang
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Imaging ellipsometry of graphene [PDF]
Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate.
Ursula Wurstbauer +2 more
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This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating
Maria Losurdo, Kurt Hingerl
openaire +3 more sources
Lateral ellipsometry resolution for imaging ellipsometry measurement
Japanese Journal of Applied Physics, 2021Abstract As an approach to integrate both single-point measurement ellipsometry and optical microscopy, imaging ellipsometry possesses the capability of measurement of distributions of optical constants and/or thickness of sample surfaces.
Lianhua Jin +4 more
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