Results 211 to 220 of about 24,227 (270)

Materials Informatics Framework for Accelerated Discovery of High-Refractive-Index 2D Materials. [PDF]

open access: yesACS Nano
Klimova LA   +6 more
europepmc   +1 more source

Ultrafast Formation of Jahn-Teller Polarons Revealed by State-Selective Excitation in Correlated Spinel Co<sub>3</sub>O<sub>4</sub>. [PDF]

open access: yesJ Am Chem Soc
Restelli S   +25 more
europepmc   +1 more source

Structural, optical and electrical properties of Si-rich and N-rich PECVD silicon nitride films. [PDF]

open access: yesSci Rep
Moussi TA   +7 more
europepmc   +1 more source

Protein microarray biosensors based on imaging ellipsometry techniques and their applications [PDF]

open access: yesProtein and Cell, 2011
After years of development, biosensors based on imaging ellipsometry and biosensors based on total internal reflection imaging ellipsometry have been successfully implemented in various engineering systems. Their experimental setups, detection principles,
Yu Niu, Jin Gang
exaly   +2 more sources

Imaging ellipsometry of graphene [PDF]

open access: yesApplied Physics Letters, 2010
Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate.
Ursula Wurstbauer   +2 more
exaly   +2 more sources
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Ellipsometry at the Nanoscale

2013
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating
Maria Losurdo, Kurt Hingerl
openaire   +3 more sources

Lateral ellipsometry resolution for imaging ellipsometry measurement

Japanese Journal of Applied Physics, 2021
Abstract As an approach to integrate both single-point measurement ellipsometry and optical microscopy, imaging ellipsometry possesses the capability of measurement of distributions of optical constants and/or thickness of sample surfaces.
Lianhua Jin   +4 more
openaire   +1 more source

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