Results 221 to 230 of about 24,227 (270)
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Autofocus of imaging ellipsometry
Applied Optics, 2022Through polarized light interacting with samples, imaging ellipsometry is capable of aiding in the study of semitransparent biological cells microscopically; it is also possible to find applications in marker-free nondestructive disease diagnosis. Often a living biological cell is sensitive to environmental conditions, and fast
Haiyan Guo +2 more
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Simplified Treatment of Ellipsometry
Journal of the Optical Society of America, 1958A straightforward treatment of the properties of elliptically polarized light reflected from thin films has been made using only the laws of elementary optics. The results are shown to be in satisfactory agreement with experiment for films of thickness up to 1600 A, far beyond the region of validity of the Drude approximation for very thin films.
J A, FAUCHER, G M, McMANUS, H J, TRURNIT
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Applied Optics, 1984
An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.
T, Yoshino, K, Kurosawa
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An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.
T, Yoshino, K, Kurosawa
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Ellipsometry of rough surfaces
Applied Optics, 1980Ellipsometry measurements on several different kinds of rough surfaces were compared with stylus measurements of the surface texture. For steeply sloped periodic surfaces, the ellipsometric angles Delta and psi varied rapidly as the angle of incidence was varied near a diffraction minimum. This effect is interpreted in terms of the Kirchhoff theory and
T V, Vorburger, K C, Ludema
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Applied Optics, 1985
An ellipsometer is described which is capable of measuring one of the related ellipsometric parameters N, S, or C as a function of time. The ellipsometer is of the standard polarizer–compensator–sample–analyzer type, in which the analyzer is a Wollaston prism.
G E, Jellison, D H, Lowndes
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An ellipsometer is described which is capable of measuring one of the related ellipsometric parameters N, S, or C as a function of time. The ellipsometer is of the standard polarizer–compensator–sample–analyzer type, in which the analyzer is a Wollaston prism.
G E, Jellison, D H, Lowndes
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Materials and Corrosion, 1968
AbstractDie Ellipsometrie, das heißt die Messung der Dicke von dünnen Filmen, ist in den letzten Jahren zunehmend zu Korrosionsuntersuchungen eingesetzt worden. Deu Verfasser beschreibt die Grundlagen der Methode sowie den Aufbau der Meßeinrichtungen und gibt Beispiele für die Anwendung auf dem Korrosionsgebiet, besonders in Zusammenhang mit der ...
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AbstractDie Ellipsometrie, das heißt die Messung der Dicke von dünnen Filmen, ist in den letzten Jahren zunehmend zu Korrosionsuntersuchungen eingesetzt worden. Deu Verfasser beschreibt die Grundlagen der Methode sowie den Aufbau der Meßeinrichtungen und gibt Beispiele für die Anwendung auf dem Korrosionsgebiet, besonders in Zusammenhang mit der ...
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Windows in ellipsometry measurements
Applied Optics, 1999The effect of windows or lenses placed between the polarization-state generator and the polarization-state detector in a general ellipsometry measurement is examined. It is found that three parameters are required for describing the effects of the window retardation on the ellipsometry measurements. Two of these window parameters can be measured at the
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Rotating depolarizer ellipsometry
Applied Optics, 1977We have built a fully automatic ellipsometer, which is spectroscopic and of the single rotating optical component type but which avoids two serious problems encountered in rotating analyzer ellipsometers.
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Interface ellipsometry; an overview
Surface Science Letters, 1980Abstract The principles of ellipsometric measurements, their relationship to reflectance and Raman scattering, the reasons for their sensitivity to monolayer films, and the meaning and modeling of the optical response of thin films are discussed in qualitative terms.
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Foundation of correlation ellipsometry
Soft Matter, 2017An experimental strategy for the detection of fluctuation dynamics at interfaces based on a combination of photon correlation spectroscopy (PCS) with a nulling ellipsometry scheme is investigated theoretically. The intensity description of ellipsometry measurements is generalized to PCS time correlation functions.
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