Results 251 to 260 of about 82,139 (350)
In situ spectroscopic ellipsometry during atomic layer deposition of Pt, Ru and Pd
, 2016 Noemi Leick +5 more
semanticscholar +1 more source
80% Fill Factor in Organic Solar Cells with a Modified Nickel Oxide Interlayer
Advanced Energy Materials, Volume 16, Issue 3, 21 January 2026.This work highlights the potential of nickel oxide as a hole transport material for organic solar cells. By studying its defect chemistry and applying surface coordination with carbazole‐based phosphonic acid molecules, the solar cell performance is improved.
David Garcia Romero +9 more
wiley +1 more source
Research on the Physical Properties and Internal Structure of PVP/Nb<sub>2</sub>O<sub>5</sub> Nanocomposite Coatings. [PDF]
Polymers (Basel)Jarka P +9 more
europepmc +1 more source
Spectroscopic ellipsometry investigation of optical properties of β-Ga2S3 single crystals
, 2018 M. Isik +2 more
openalex +2 more sources
Advanced Energy Materials, Volume 16, Issue 3, 21 January 2026.Exciton diffusion length in organic semiconductor films is determined from encounter/annihilation rates. Non‐normalized exciton densities and proper intrinsic lifetime reference avoid over‐parametrization of the fits. Monte Carlo Simulation of individual molecule‐to‐molecule hops reproduce these results (②) when matching lattice constant and hoping ...
Wenchao Yang +12 more
wiley +1 more source
Comprehensive Optoelectronic Study of Copper Nitride: Dielectric Function and Bandgap Energies. [PDF]
Nanomaterials (Basel)Ballester M +8 more
europepmc +1 more source
Stability of Organic Photovoltaics: From Root Causes to Advanced Analytical Techniques
Advanced Energy Materials, Volume 16, Issue 3, 21 January 2026.This review explains the causes and mechanisms of degradation in organic photovoltaics (OPVs). It explores how various factors, including heat, light, oxygen, and inherent material properties, influence OPV stability. The study categorizes degradation pathways and analyzes their impact on device performance, providing insights into the fundamental ...
Yelim Choi +6 more
wiley +1 more source
Advanced Intelligent Systems, Volume 8, Issue 1, January 2026.A real‐time and noncontact approach predicts etch depth in plasma etching using digital image colorimetry and machine learning. Red, green, and blue features from in situ images enable accurate predictions without relying on process parameters. Optical emission spectroscopy provides process diagnostics, ensuring stable operating conditions. This method
Minji Kang +14 more
wiley +1 more source