Results 261 to 270 of about 24,227 (270)

Comparison of Si surface roughness measured by atomic force microscopy and ellipsometry

Applied Physics Letters, 1996
C R Helms, Helms C R
exaly  

Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry

Applied Physics Letters, 1998
H C Ong, Jiyan Dai, R P H Chang
exaly  

Ellipsometry

2003
openaire   +1 more source

Ellipsometry

2001
openaire   +1 more source

Ellipsometry

2016
openaire   +1 more source

Expanding horizons: new developments in ellipsometry and polarimetry

Thin Solid Films, 2004
exaly  

Ellipsometry

2013
openaire   +1 more source

Ellipsometry � Principles

2023
openaire   +1 more source

Ellipsometry

2010
openaire   +1 more source

Spectroscopic Ellipsometry

2018
openaire   +1 more source