Results 251 to 260 of about 24,227 (270)

UV-irradiation induced modification of PDMS films investigated by XPS and spectroscopic ellipsometry

Surface Science, 2003
Thomas Lippert, Rüdiger Kotz
exaly  

Low-temperature growth of silicon dioxide films: A study of chemical bonding by ellipsometry and infrared spectroscopy

Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 1987
E A Irène
exaly  

Optical Properties of CuO Studied by Spectroscopic Ellipsometry

Journal of the Physical Society of Japan, 1998
Hiroyuki Yamaguchi, Taizo Masumi, Sadao Adachi   +2 more
exaly  

Total internal reflection ellipsometry: principles and applications

Applied Optics, 2004
H Arwin
exaly  

Ellipsometry

Optics & Laser Technology, 1977
openaire   +1 more source

Spectroscopic ellipsometry of thin film and bulk anatase (TiO2)

Journal of Applied Physics, 2003
G E Jellison, L A Boatner, J D Budai
exaly  

The use of ellipsometry to study adsorption on hydrogels

Biomaterials, 1985
Nicholas A Peppas
exaly  

Ellipsometry

Vacuum, 1972
openaire   +1 more source

The method of total internal reflection ellipsometry for thin film characterisation and sensing

Thin Solid Films, 2008
Alexei Nabok
exaly  

Ellipsometry

2015
openaire   +1 more source